Multi-IED Waveform Analysis for Faster Power Event Diagnosis

The patent replaces manual mechanical analysis of waveform captures with an automated computer-based system. The controller automatically receives waveform capture data from multiple IEDs, analyzes the data to identify electrical events, classifies characteristics, and determines relevancy without human intervention. This substitution of manual mechanical analysis with automated electronic processing directly resolves the contradiction by maintaining diagnostic accuracy while dramatically improving analysis speed and productivity.

The system performs self-service by automatically analyzing waveform captures and generating diagnostic conclusions without requiring external manual analysis. The controller autonomously receives data from IEDs, processes the waveform information, identifies electrical events, and provides diagnostic outputs. This self-service capability allows the system to maintain high diagnostic accuracy while eliminating the time-consuming manual analysis step, thereby resolving the productivity issue.

The patent replaces manual mechanical analysis with automated electronic processing that maintains diagnostic thoroughness while eliminating time consumption. The controller systematically processes waveform capture data from multiple IEDs, identifies electrical events, classifies characteristics, and determines relevancy through automated algorithms. This substitution ensures comprehensive diagnostic coverage without the time investment required for manual analysis, directly resolving the contradiction between thoroughness and time loss.

The system enables continuous automated analysis of waveform captures without interruption or manual intervention. The controller continuously receives waveform data from IEDs, processes it in real-time, and generates diagnostic conclusions continuously. This continuous operation maintains diagnostic thoroughness while eliminating the intermittent nature of manual analysis, thereby resolving the time consumption issue.

The controller is designed as a universal multi-functional device that can receive, process, and analyze waveform capture data from multiple different IEDs simultaneously. It performs various functions including data reception, waveform analysis, electrical event identification, characteristic classification, and relevancy determination within a single integrated system. This multi-functionality achieves comprehensive system coverage without proportionally increasing complexity, as the same controller handles all analysis tasks for multiple devices.

The patent merges the analysis functions for multiple IEDs into a single integrated processing system. Instead of requiring separate analysis systems for each device, the controller consolidates reception, processing, and analysis of waveform data from multiple IEDs into one unified operation. This merging approach expands system coverage to include multiple devices while keeping the overall system complexity manageable through integration rather than multiplication of separate systems.

The patent replaces complex manual analysis procedures with a relatively simple automated controller system. The controller uses standard electronic processing capabilities to automatically receive waveform data, identify electrical events, classify characteristics, and generate diagnostic conclusions. This substitution achieves high productivity and analysis speed without requiring overly complex automation infrastructure, as the system leverages conventional electronic processing rather than sophisticated complex mechanisms.

The automated controller performs self-service analysis without requiring external complex processing systems or manual intervention. It autonomously processes waveform captures from multiple IEDs using its integrated capabilities, generating diagnostic outputs independently. This self-service approach improves productivity by eliminating manual analysis steps while keeping the automation system complexity low, as the controller uses its own built-in processing capabilities rather than requiring external complex systems.