Spectral/Fourier Analysis TRIZ Cases
- Device Array Analysis Using SHG for Bulk Defect Detection
Second-harmonic imaging detects emitted signals from device arrays to identify defects, while wavelength segmentation adds bulk-material information.
- Phase Noise Measurement Using Spur-Selective Periodic Jitter Analysis
Spur-selective filtering and inverse transformation reconstruct phase signals for peak periodic jitter estimation without RMS or model-fit inaccuracies.
- Real-Equivalent-Time Oscilloscope Using Software Clock Recovery
Software clock recovery reconstructs repeating signals without hardware triggers, using one ADC to lower oscilloscope cost and interleaving errors.
- Acquired Waveform Metadata for Large-File Signal Analysis
Measurements are attached to waveform files during acquisition, making large signal datasets searchable without repeated reprocessing.
- Multi-Channel Antenna Receiver ADC Averaging for RF Analysis
Routing one RF signal into multiple ADC channels and averaging digital outputs improves SNR and NSD for spectrum analysis.