Multi-Voltage Metal Line Routing via Local Quality Spacing

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Solution Overview

Problem

Conventional EDA tools for designing integrated circuits struggle to efficiently route metal lines with different voltages on the same metal layer, leading to excessive leakage due to uniform spacing rules, which are insufficient for higher voltage differences.

Innovation Solution

A method is introduced where metal lines are routed with varying spaces based on their respective voltages by defining different layer types with specific attributes, allowing the routing program to assign appropriate spaces according to the voltage information, and merging these layers for mask making.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If uniform spacing rules are used for all metal lines on the same layer, then the routing process is simple and fast, but excessive leakage occurs between metal lines with higher voltage differences

Engineering Contradiction:
Improveleakage preventionVSAvoidrouting complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent applies local quality by assigning different spacing rules to different regions of the same metal layer based on voltage characteristics. Specifically, high-voltage metal lines are assigned a first spacing rule with larger minimum spacing, while low-voltage metal lines are assigned a second spacing rule with smaller minimum spacing. This allows the routing system to optimize leakage prevention for high-voltage lines without unnecessarily increasing spacing for low-voltage lines, thereby maintaining routing efficiency while improving reliability.

Inventive Principle:
Principle #3Local quality

2Reliability

If larger spacing is used for high voltage lines, then leakage is reduced, but the area occupied by metal lines increases

Engineering Contradiction:
Improveleakage preventionVSAvoidmetal layer area
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The patent implements local quality by applying different spacing rules selectively to different voltage groups. High-voltage metal lines receive larger spacing (first spacing rule) only where necessary for leakage prevention, while low-voltage metal lines use smaller spacing (second spacing rule) to minimize area consumption. This selective approach ensures that area is consumed only where voltage differences require it, rather than uniformly across the entire metal layer.

Inventive Principle:
Principle #3Local quality

3Reliability

If multiple spacing rules are implemented for different voltages, then leakage is controlled, but the routing process becomes more complex

Engineering Contradiction:
Improveleakage controlVSAvoidrouting efficiency
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent applies parameter changes by introducing voltage information as a new parameter that influences spacing rule selection. The routing system reads voltage information from net data, assigns metal lines to voltage groups based on their voltage characteristics, and automatically applies the appropriate spacing rule (first or second) to each group. This automated parameter-based assignment maintains routing efficiency while enabling precise leakage control through multiple spacing rules.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS7865852B2Method for automatically routing multi-voltage multi-pitch metal lines
Publication Date: 2011.01.04 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US7865852B2 patent drawing
  • US7865852B2 patent drawing
  • US7865852B2 patent drawing

AI summary

A method for program routing a circuit with at least a first and second voltages in a single layer is disclosed, which comprises defining a first and second layer types corresponding to the first and second voltages, respectively, specifying at least one first attribute for the first layer type and at least one second attribute for the second layer type, specifying at least one first net with a first voltage and at least one second net with a second voltage, reading the voltage information associated with the first net and the second net by a computer program, routing at least one first polygon for the first net onto the first layer type with the first attribute by the computer program, and routing at least one second polygon for the second net onto the second layer type with the second attribute by the same computer program.