Multi-Layer Display Apparatus with LTPS and Oxide Transistors

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Solution Overview

Problem

The manufacturing process of display apparatuses using multiple thin film transistors with different semiconductor materials often results in damage to semiconductor elements, affecting the operation characteristics of pixels and increasing production costs.

Innovation Solution

A display apparatus design where thin film transistors are formed on different layers using low temperature poly silicon and oxide semiconductor materials, with an inorganic insulating layer and multi-layer buffer layers to reduce damage and improve reliability, and a blocking layer is used to suppress hydrogen diffusion and charge blocking.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If multiple thin film transistors with different semiconductor materials are formed on the same substrate, then pixel operation characteristics are improved, but damage to semiconductor elements increases

Engineering Contradiction:
Improvepixel operation characteristicsVSAvoiddamage to semiconductor elements
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent divides the thin film transistor structure into multiple separate layers, with each layer containing transistors made of different semiconductor materials (e.g., LTPS in one layer, oxide semiconductor in another layer). This segmentation allows each semiconductor type to be optimized independently while preventing mutual damage, as harmful factors affecting one semiconductor type are contained within its specific layer and do not directly impact other semiconductor layers.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces intermediate layers between different semiconductor layers, including buffer layers and insulating layers. These intermediary layers act as protective barriers that prevent damage transmission between different semiconductor materials. For example, buffer layers protect semiconductor elements from damage during manufacturing processes, while insulating layers prevent electrical interference and charge accumulation that could harm adjacent semiconductor types.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If multiple thin film transistors with different semiconductor materials are formed on the same substrate, then operation characteristics of pixels are improved, but manufacturing complexity increases

Engineering Contradiction:
Improveoperation characteristics of pixelsVSAvoidmanufacturing process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent segments the manufacturing process into distinct stages for different semiconductor layers. Each layer can be manufactured using optimized processes specific to that semiconductor type without interfering with other layers. This segmentation simplifies the overall manufacturing complexity by allowing parallel or sequential processing of different semiconductor types with their respective optimal conditions.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent designs the multi-layer structure with universal manufacturing approaches where certain process steps can be applied across multiple layers simultaneously. For example, similar deposition and patterning techniques can be used for different semiconductor layers, reducing the need for entirely separate manufacturing lines and simplifying the overall process complexity despite the increased device structure.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Object-affected harmful factors

If additional metal layers are added to block hydrogen diffusion, then semiconductor element protection is improved, but manufacturing process complexity increases

Engineering Contradiction:
Improvehydrogen diffusion protectionVSAvoidmanufacturing process complexity
Core Design Contradiction:
Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The patent uses buffer layers and insulating layers as intermediary protective barriers between semiconductor elements and potential hydrogen sources. These intermediary layers effectively block hydrogen diffusion without requiring additional metal layers, thereby maintaining manufacturing process simplicity while achieving the desired protection effect.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent employs thin buffer and insulating layers that can be deposited using standard semiconductor manufacturing techniques. These layers provide effective hydrogen barrier functionality at low cost and with simple processes, replacing the need for more complex and expensive metal barrier layers. The thin nature of these layers allows for easy integration without significantly increasing manufacturing complexity.

Inventive Principle:
Principle #27Cheap short-living objects (Disposable)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design enhances the reliability of the display apparatus by reducing semiconductor damage, improving pixel operation characteristics, and simplifying the manufacturing process by eliminating the need for additional metal layers, while reducing production costs.

Implementation Method 1

an inorganic insulating layer between the first substrate and the second substrate

Methodology Applied
Scientific EffectDiffusion barrier: Diffusion Barrier

Implementation Method 2

a first buffer layer on the substrate, wherein the first buffer layer includes n+1 layers

Methodology Applied
Scientific EffectCharge blocking: Diffusion Barrier

Data Source

PatentUS11063068B2Display apparatus
Publication Date: 2021.07.13 LG DISPLAY CO LTD
  • US11063068B2 patent drawing
  • US11063068B2 patent drawing
  • US11063068B2 patent drawing

AI summary

A display apparatus includes a substrate having a first substrate, a second substrate, and an inorganic insulating layer between the first substrate and the second substrate. A first buffer layer is on the substrate, wherein the first buffer layer includes n+1 layers, and ā€˜n’ is 0 or an even number. A first thin film transistor, a second thin film transistor, and a storage capacitor are each on the first buffer layer. The first thin film transistor includes a first active layer formed of a low temperature poly silicon material. The second thin film transistor includes a second active layer formed of an oxide semiconductor material. The storage capacitor includes a first capacitor electrode and a second capacitor electrode.