Multiplier Temperature Sensing Circuit for Accurate Thermal Detection
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Solution Overview
Problem
Existing temperature detectors face challenges in enhancing sensitivity and accuracy for temperature measurement in electronic devices due to limitations in detecting temperature variations effectively.
Innovation Solution
A temperature detector design incorporating a first temperature coefficient component, a multiplier, and an impedance component, which amplifies detection current to reflect temperature variations of a circuit under test, utilizing a node formed between the temperature coefficient component and the multiplier to correlate voltage and temperature, thereby improving sensitivity and accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a conventional temperature detector is used to measure temperature variations, then the device can detect temperature changes, but the sensitivity and accuracy of temperature measurement are insufficient
Solution Approach 1:
The patent introduces a temperature coefficient component as an intermediary element that converts temperature variations into voltage changes. This component acts as a mediator between the temperature being measured and the detection circuit, enabling more precise measurement through voltage amplification while maintaining detection sensitivity.
Solution Approach 2:
The patent utilizes the temperature coefficient of the component to convert temperature parameter changes into voltage parameter changes. By selecting components with specific temperature coefficients and configuring them in a multiplier circuit, the system amplifies small temperature variations into significant voltage changes, thereby improving measurement accuracy without sacrificing sensitivity.
2Reliability
If the detection current is amplified to reflect temperature variations, then the sensitivity of temperature detection is improved, but the risk of thermal runaway increases
Solution Approach 1:
The patent implements a feedback mechanism through the multiplier circuit configuration, where the output is fed back to control the amplification process. This feedback loop automatically regulates the detection current, preventing excessive amplification that could lead to thermal runaway while maintaining sufficient sensitivity for accurate temperature detection.
Solution Approach 2:
The patent employs dynamic current control through the multiplier circuit, which adjusts the detection current based on the temperature signal. This dynamic adjustment allows the system to amplify temperature variations effectively while automatically reducing current when temperature increases become too large, thereby preventing thermal runaway.
3Measurement precision
If the detection current is increased to improve temperature detection accuracy, then the measurement precision is improved, but the operating region of transistors may exceed linear limits
Solution Approach 1:
The patent uses dynamic current control through the multiplier circuit to adjust the operating point of transistors based on temperature conditions. This ensures that transistors remain within their linear operating region across varying temperature conditions, maintaining measurement precision without compromising component stability.
Solution Approach 2:
The feedback mechanism in the multiplier circuit continuously monitors the operating conditions and adjusts the detection current to keep transistors within their linear operating region. This feedback control prevents the system from entering non-linear regions that would compromise measurement accuracy and component stability.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution effectively enhances sensitivity and accuracy of temperature detection by amplifying small temperature variations into significant changes in detection current, reducing the risk of thermal runaway and maintaining the operating region of transistors within linear limits.
Implementation Method 1
a first temperature coefficient component arranged in proximity to a circuit under test... a voltage at the node is positively correlated to the temperature of the circuit under test... an amplified detection current flowing to the first terminal of the multiplier is positively correlated to the temperature of the circuit under test
Data Source
Figure 1~2
Figure 3
Figure 4~5
AI summary
A temperature detector (1) is used to detect a temperature of a circuit under test, and includes a temperature coefficient component (10), a multiplier (12), an impedance component (Zl) and a node (N1). The temperature coefficient component (10) is arranged in proximity to the circuit under test. A control terminal of the multiplier (12) is coupled to the temperature coefficient component (10). The impedance component (Zl) is coupled between the second terminal of the temperature coefficient component (10) and the control terminal of the multiplier (12), or between a second terminal of the multiplier (12) and a third voltage terminal. The node (N1) is formed between the temperature coefficient component (10) and the multiplier (12). An amplified detection current (Ia) flowing to a first terminal of the multiplier (12) is positively correlated to the temperature of the circuit under test.