Nanostructure Transistor Stacking for Variable Channel Widths

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Solution Overview

Problem

Existing integrated circuits face challenges in increasing computing power while maintaining area efficiency, as conventional transistors do not easily allow for variations in channel width without increasing substrate area.

Innovation Solution

The integration of nanostructure transistors with adjustable effective channel widths is achieved by stacking multiple nanostructures and controlling the connection of these nanostructures to the source/drain regions through epitaxial growth, allowing for varying channel widths without increasing substrate area.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If conventional transistors are used to increase computing power, then the number of transistors can be increased, but the substrate area required increases proportionally

Engineering Contradiction:
Improvecomputing powerVSAvoidsubstrate area
Core Design Contradiction:
ProductivityVSArea of stationary object

Solution Approach 1:

The patent transitions from planar transistor layouts to vertically stacked three-dimensional transistor structures. Multiple channel regions are stacked vertically above the substrate, allowing multiple transistors to occupy a smaller footprint area while maintaining electrical functionality. This vertical stacking enables increased transistor density without proportionally increasing substrate area.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The transistor channel region is divided into multiple discrete stacked segments or channel regions. Each channel region can be independently controlled via separate gate electrodes, allowing the transistor to function as multiple parallel channels. This segmentation increases effective channel width and computing capability within a compact vertical structure.

Inventive Principle:
Principle #1Segmentation

2Adaptability or versatility

If nanostructure transistors with varied channel widths are created, then device performance can be optimized, but design complexity increases

Engineering Contradiction:
Improvedevice performance optimizationVSAvoiddesign complexity
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

Different channel regions within the stacked transistor structure have different effective channel widths, allowing local optimization of device characteristics. By varying the width of individual channel regions, the transistor can provide different performance characteristics (e.g., high-speed vs. low-power) in different vertical segments while maintaining a unified structural framework.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The stacked transistor structure serves multiple functions simultaneously: it provides both high-speed performance through wider channel regions and low-power performance through narrower channel regions within the same device structure. This multi-functionality eliminates the need for separate transistor designs for different performance requirements.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the creation of transistors with specific performance characteristics, such as lower power consumption or higher speed, without increasing design complexity or substrate area, thereby improving device performance and wafer yield.

Implementation Method 1

controlling the connection of these nanostructures to the source/drain regions through epitaxial growth

Methodology Applied
Scientific EffectEpitaxial growth: Epitaxy

Data Source

PatentUS12342587B2Integrated circuit with nanostructure transistors and bottom dielectric insulators
Publication Date: 2025.06.24 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US12342587B2 patent drawing
  • US12342587B2 patent drawing
  • US12342587B2 patent drawing

AI summary

An integrated circuit includes a first nanostructure transistor including a plurality of first semiconductor nanostructures over a substrate and a source/drain region in contact with each of the first semiconductor nanostructures. The integrated circuit includes a second nanostructure transistor including a plurality of second semiconductor nanostructures and a second source/drain region in contact with one or more of the second semiconductor nanostructures but not in contact with one or more other second semiconductor nanostructures.