Near Field Optical Microscope Probe Alignment
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Solution Overview
Problem
Existing near-field optical measurement devices face challenges in precisely aligning probes and illumination systems, leading to reduced intensity and increased noise due to misalignment, and current methods are either costly, time-consuming, or prone to irreproducibility.
Innovation Solution
A device with at least two far-field optical imaging systems arranged to image the probe tip from different directions, typically at an angle of at least 30°, allowing for precise adjustment and alignment of the probe and illumination, using high-magnification optical systems and a parabolic primary mirror to facilitate effective light collection and focusing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a conventional monitoring system with optical axis perpendicular to the sample surface is used, then the sample and cantilever can be monitored, but the probe tip cannot be imaged for alignment and focusing purposes
Solution Approach 1:
The patent introduces a secondary imaging system with an optical axis that is not perpendicular to the sample surface, providing a different viewing dimension. This allows the probe tip to be imaged from an angle where it is visible, while the primary monitoring system maintains its perpendicular orientation for sample and cantilever monitoring. The multi-dimensional imaging approach resolves the contradiction by adding spatial complexity rather than modifying the existing simple perpendicular system.
2Reliability
If precisely aligned probes and illumination systems are used, then high signal-to-noise ratio is achieved, but alignment is time-consuming and difficult
Solution Approach 1:
The patent employs optical imaging systems that provide visual feedback of the probe tip position and the illumination beam location. This feedback mechanism allows operators to directly observe and adjust the alignment in real-time, significantly reducing the time and difficulty of alignment compared to indirect methods. The imaging systems convert the abstract alignment task into a visual one, enabling quick and reliable positioning.
Solution Approach 2:
The optical imaging systems create visual copies (images) of the probe tip and illumination beam, allowing operators to work with these representations rather than the actual physical components. This copying approach makes the alignment process more intuitive and faster, as the visual information can be processed more quickly than direct physical measurement and adjustment.
3Ease of operation
If specialized probes with visible tips are used, then alignment is easier, but probe cost increases and variant selection is limited
Solution Approach 1:
The patent introduces optical imaging systems as an intermediary tool that enables visualization of standard probe tips without requiring specialized probe designs. The imaging system acts as a mediator between the invisible probe tip and the operator's visual system, providing alignment capability for conventional probes. This approach maintains probe versatility and cost-effectiveness while achieving the alignment ease previously only available with specialized visible-tip probes.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables easy, quick, and reproducible alignment of the probe and illumination, improving signal-to-noise ratio and maintaining precise illumination at the tip apex, even for opaque specimens, without the need for expensive or limited variant probes.
Implementation Method 1
optical imaging systems arranged to image the tip from different directions
Implementation Method 2
high-magnification optical systems and a parabolic primary mirror to facilitate effective light collection and focusing
Implementation Method 3
parabolic primary mirror to facilitate effective light collection and focusing
Implementation Method 4
parabolic primary mirror to facilitate effective light collection and focusing
Implementation Method 5
The (near-field) probe is illuminated at its tip by focused light, e.g. in the visible or mid-infrared spectrum, to generate scattered light during tip-specimen interaction
Data Source
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AI summary
The invention relates to a device for conducting near-field optical measurements of a specimen comprising an optical imaging system, the use of such device and to a method for adjusting the probe or the illumination of the probe in such a device.