Needle-Shaped Field Plate Structures for Semiconductor Devices

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Solution Overview

Problem

Existing semiconductor devices with stripe-shaped field electrodes face challenges in achieving high dopant concentrations in the drift portion without compromising blocking capability, and they have high parasitic capacitances and on-state resistance.

Innovation Solution

The use of needle-shaped first and second field plate structures that extend into the semiconductor die, forming a grid-like gate structure, which increases the total channel width per unit area and reduces parasitic capacitances, while maintaining high dopant concentrations and blocking capability.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If stripe-shaped field electrode structures are used, then the device structure is simple, but the parasitic capacitances and on-state resistance are high

Engineering Contradiction:
Improvefield electrode structureVSAvoidparasitic capacitance
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The field electrode structure is segmented into multiple needle-shaped field plate structures arranged in a grid pattern, replacing the conventional stripe-shaped continuous structure. This segmentation reduces the overlapping area between field electrodes and drift region, thereby reducing parasitic capacitances while maintaining electrical field control effectiveness.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The field electrode structure transitions from a two-dimensional stripe pattern to a three-dimensional needle-shaped configuration extending vertically into the semiconductor substrate. This dimensional change allows for reduced parasitic capacitance by minimizing the lateral overlap area while maintaining the vertical electric field control function.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Reliability

If needle-shaped field plate structures are used, then parasitic capacitances are reduced, but the device complexity increases

Engineering Contradiction:
Improveparasitic capacitanceVSAvoidfield plate structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The field electrode is segmented into multiple discrete needle-shaped structures arranged in a regular grid pattern. While this increases structural complexity compared to a continuous stripe, the regular pattern allows for standardized manufacturing processes and predictable electrical characteristics, making the complexity manageable and beneficial for performance.

Inventive Principle:
Principle #1Segmentation

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enhances the semiconductor device's performance by reducing on-state resistance and maintaining high blocking capability, while also minimizing parasitic capacitances, leading to improved reliability and efficiency.

Implementation Method 1

field plate structures extending from one side into the semiconductor die deplete a drift portion of the semiconductor die

Methodology Applied
Scientific EffectDepletion:

Implementation Method 2

Shrinking the field plate structures to needle-shaped field plate structures facilitates a grid-like gate structure between the field plate structures, wherein the grid-like gate structure provides a larger total channel width per unit area

Methodology Applied
Scientific EffectGeometric configuration: Geometry

Data Source

PatentUS20220376062A1Semiconductor device having needle-shaped first field plate structures and needle-shaped second field plate structures
Publication Date: 2022.11.24 INFINEON TECH AUSTRIA AG
  • US20220376062A1 patent drawing
  • US20220376062A1 patent drawing
  • US20220376062A1 patent drawing

AI summary

A semiconductor device includes a transistor cell region, and a first termination region devoid of transistor cells. The transistor cell region includes a gate structure, a plurality of needle-shaped first field plate structures, body regions of a second conductivity type, and source regions of a first conductivity type. The first termination region surrounds the transistor cell region and includes needle-shaped second field plate structures. The needle-shaped first field plate structures are arranged in a first pattern and the needle-shaped second field plate structures are arranged in a second pattern.