Nitride Gate Structure Integrating HEMT and Schottky Junctions
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Solution Overview
Problem
Current nitride-based semiconductor devices face challenges in integrating high-electron-mobility transistors (HEMTs) with Schottky diodes without increasing device size and complexity, as separate configurations for HEMT and Schottky diodes require additional space and connections.
Innovation Solution
A nitride-based semiconductor device configuration is developed, where a conductive layer forms a metal-semiconductor junction with doped nitride-based semiconductor layers, creating a Schottky junction integrated within the gate structure, allowing for both HEMT and Schottky diode functionality in a single device without increasing dimensions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If separate configurations for HEMT and Schottky diodes are used, then device functionality is achieved, but device size and complexity increase
Solution Approach 1:
The patent merges the HEMT and Schottky diode configurations into a single integrated device structure. The gate structure of the HEMT is combined with doped nitride-based semiconductor layers and a conductive layer to form both the HEMT channel and the Schottky junction, eliminating the need for separate device configurations and reducing overall device size and complexity.
Solution Approach 2:
The integrated gate structure serves multiple functions simultaneously: it acts as the gate for the HEMT device while also forming the Schottky junction for diode functionality. The doped nitride-based semiconductor layers and conductive layer configuration enables the same structural region to perform both transistor gating and rectification functions.
2Adaptability or versatility
If separate configurations for HEMT and Schottky diodes are used, then device functionality is achieved, but additional space and connections are required
Solution Approach 1:
The patent merges the HEMT and Schottky diode configurations into a single integrated device structure. The gate structure of the HEMT is combined with doped nitride-based semiconductor layers and a conductive layer to form both the HEMT channel and the Schottky junction, eliminating the need for separate device configurations and reducing overall device size and complexity.
3Reliability
If multiple processing steps are used to form both Schottky and ohmic contacts, then contact quality is improved, but manufacturing complexity increases
Solution Approach 1:
The patent merges the formation of Schottky and ohmic contacts into a single integrated manufacturing sequence. By combining the metal layer deposition that forms Schottky contacts with subsequent processing steps that form ohmic contacts to doped regions, the patent reduces the number of separate processing campaigns while maintaining contact quality.
Solution Approach 2:
The patent performs preliminary doping of nitride-based semiconductor layers during the epitaxial growth stage, before metal contact formation. This preliminary action of creating doped regions during layer formation simplifies subsequent contact fabrication by pre-positioning the ohmic contact sites, reducing the need for additional complex doping steps.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This integration enhances electrical properties by promoting saturation current and maintaining device size within acceptable limits, suitable for applications like DC-DC converter circuits.
Implementation Method 1
The at least one conductive layer includes metal, and is in contact with the second nitride-based semiconductor layer to form a metal-semiconductor junction therebetween
Data Source
AI summary
A nitride-based semiconductor device including a first and a second nitride-based semiconductor layers, a source electrode and a drain electrode, and a gate structure. The gate structure includes at least one conductive layer and two or more doped nitride-based semiconductor layers. The at least one conductive layer includes metal, and is in contact with the second nitride-based semiconductor layer to form a metal-semiconductor junction therebetween. The two or more doped nitride-based semiconductor layers are in contact with the second nitride-based semiconductor layer and abut against the conductive layer, so as to form contact interfaces abutting against the metal-semiconductor junction with the second nitride-based semiconductor.


