Nonvolatile Memory Switching Between Reference Current and Complementary Reading Systems

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Solution Overview

Problem

Existing semiconductor devices lack the ability to freely adjust the memory size of data and code areas, as the choice between reference current and complementary reading systems is determined by hardware, limiting user flexibility.

Innovation Solution

A semiconductor device that can switch between reference current and complementary reading systems, allowing for flexible adjustment of memory sizes in both data and code areas by incorporating a nonvolatile memory module with a hierarchy sense amplifier band and driver circuits that enable switching between the two systems.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If the reference current reading system is employed, then the read speed is fast and storage capacity is increased, but the rewritable count becomes small

Engineering Contradiction:
Improveread speedVSAvoidrewritable count
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The memory is divided into two distinct areas: a code area that uses the reference current reading system for fast read operations, and a data area that uses the complementary reading system for high rewrite durability. This segmentation allows each area to utilize the reading system best suited for its specific requirements.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different reading systems are applied to different regions of the memory based on local requirements. The code area employs reference current reading for speed-critical operations, while the data area employs complementary reading for durability-critical operations, optimizing overall system performance.

Inventive Principle:
Principle #3Local quality

2Reliability

If the complementary reading system is employed, then the rewritable count is increased and read current is reduced, but the storage capacity decreases and memory size increases

Engineering Contradiction:
Improverewritable countVSAvoidstorage capacity
Core Design Contradiction:
ReliabilityVSQuantity of substance

Solution Approach 1:

The memory is divided into two distinct areas: a code area that uses the reference current reading system for fast read operations, and a data area that uses the complementary reading system for high rewrite durability. This segmentation allows each area to utilize the reading system best suited for its specific requirements.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different reading systems are applied to different regions of the memory based on local requirements. The code area employs reference current reading for speed-critical operations, while the data area employs complementary reading for durability-critical operations, optimizing overall system performance.

Inventive Principle:
Principle #3Local quality

3Device complexity

If the reading system is determined by hardware, then the system configuration is fixed, but the user cannot freely adjust the memory size of data area and code area

Engineering Contradiction:
Improvesystem configurationVSAvoidmemory size adjustment flexibility
Core Design Contradiction:
Device complexityVSAdaptability or versatility

Solution Approach 1:

The system transitions from a static, hardware-fixed configuration to a dynamic, software-configurable system. Users can programmatically adjust the boundaries between the code area and data area, allowing flexible allocation of memory resources based on different application requirements without changing the physical hardware structure.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS10102915B2Semiconductor device including nonvolatile memory configured to switch between a reference current reading system and a complimentary reading system
Publication Date: 2018.10.16 RENESAS ELECTRONICS CORP
  • US10102915B2 patent drawing
  • US10102915B2 patent drawing
  • US10102915B2 patent drawing

AI summary

The present invention provides a semiconductor device including a nonvolatile memory of which the memory size of a data area and the memory size of a code area can be freely changed. The semiconductor device according to one embodiment includes a nonvolatile memory which can switch between a reference current reading system which performs data read by comparing a current flowing through a first memory cell as a read target and the reference current and a complementary reading system which performs data read by comparing currents flowing through a first memory cell and a second memory cell storing complementary data, as a read target.