Nonvolatile Memory Device Coupling Noise Reduction

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Solution Overview

Problem

Conventional nonvolatile memory devices face challenges in minimizing coupling noise between bit lines, especially as cell size decreases, affecting the accuracy of program and verification operations.

Innovation Solution

The implementation of a nonvolatile memory device with a current source and memory cell string, where the programming status of memory cells is determined by the voltage of a first node, and a method involving a current supply unit, bit line switch, and sense nodes to selectively couple the memory cell string, allowing for precise threshold voltage measurement and reduced coupling noise.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Object-generated harmful factors

If conventional sequential program and verification operations are performed on even and odd pages, then the coupling noise between bit lines can be minimized, but the sensing accuracy deteriorates when cell size is reduced

Engineering Contradiction:
Improvecoupling noise between bit linesVSAvoidsensing accuracy
Core Design Contradiction:
Object-generated harmful factorsVSMeasurement precision

Solution Approach 1:

The patent introduces a current source as an intermediary element that is selectively coupled to the memory cell string through a bit line switch. This current source provides a controlled current path that isolates the sensing operation from coupling noise on other bit lines, thereby maintaining sensing accuracy even when cell size is reduced and conventional noise minimization methods become ineffective

Inventive Principle:
Principle #24Intermediary (Mediator)

2Quantity of substance

If cell size is reduced to increase memory density, then the memory capacity is improved, but the coupling noise between bit lines increases affecting verification operation

Engineering Contradiction:
Improvememory densityVSAvoidcoupling noise between bit lines
Core Design Contradiction:
Quantity of substanceVSObject-generated harmful factors

Solution Approach 1:

The bit line switch acts as an intermediary that selectively connects the current source to the target memory cell string during verification operations. This selective coupling ensures that current flows only through the intended cell string, preventing noise coupling from adjacent bit lines and maintaining signal integrity despite reduced cell spacing

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent changes the operational parameters by using a current source instead of voltage-based sensing, and by dynamically controlling the coupling state through the bit line switch. This parameter change allows the system to maintain high sensing accuracy despite the physical constraint of reduced cell size

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances the verification operation by accurately determining the programming state of memory cells with reduced noise, improving sensing accuracy and operational efficiency.

Implementation Method 1

determining a voltage supplied to a node between the current supply unit and the memory cell string, according to the amount of current supplied by the current supply unit

Methodology Applied
Scientific EffectElectrical Resistance: Electrical Resistance

Data Source

PatentUS8120964B2Nonvolatile memory device and method of operating the same
Publication Date: 2012.02.21 SK HYNIX INC
  • US8120964B2 patent drawing
  • US8120964B2 patent drawing
  • US8120964B2 patent drawing

AI summary

A nonvolatile memory device includes a first node, a current source configured to have a current value determined according to a voltage supplied to the first node, and a memory cell string coupled to the first node, the memory cell string including at least one memory cell. Whether a memory cell included in the memory cell string has been programmed is determined based on the voltage supplied to the first node.