Notched RDL Capture Pads for IC Die Connector Density

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Solution Overview

Problem

Conventional wafer chip scale package (WCSP) designs face limitations in increasing the number of bonding connectors on IC dies without enlarging the die size or requiring changes to die pad or I/O layouts, which can lead to issues like shorting and leakage between different nets.

Innovation Solution

The solution involves altering RDL designs by notching RDL capture pads near adjacent die pads, allowing metal bonding connectors to overhang and increase spacing, while sloping the edges of notched RDL capture pads and adjusting via positions to maintain reliability and avoid design rule violations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If the number of bonding connectors is increased on the WCSP die, then the I/O connection capacity is improved, but the die size must be enlarged to accommodate additional connectors while maintaining clearance design rules

Engineering Contradiction:
Improvenumber of bonding connectorsVSAvoiddie size
Core Design Contradiction:
Quantity of substanceVSArea of stationary object

Solution Approach 1:

The RDL capture pad is segmented by introducing a notch that divides it into distinct regions. This segmentation allows the bonding connector to be positioned such that part of it overhangs the notched RDL capture pad, effectively reducing the space required per connector and enabling higher connector density without increasing die size.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The invention utilizes the vertical dimension by allowing the bonding connector to overhang the RDL capture pad in the lateral direction. This dimensional approach violates conventional ball-to-pad clearance rules by using the overhang configuration, thereby maximizing the use of available die area for accommodating more connectors.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Quantity of substance

If the RDL capture pad is notched to allow bonding connector overhang, then the spacing between connectors can be reduced, but the reliability may be compromised due to potential shorting or leakage between different nets

Engineering Contradiction:
Improvenumber of bonding connectorsVSAvoidelectrical isolation between nets
Core Design Contradiction:
Quantity of substanceVSReliability

Solution Approach 1:

The notch is strategically positioned to extract or remove the problematic overlapping region between the RDL capture pad and the adjacent die pad. This extraction creates sufficient lateral spacing that prevents electrical shorting or leakage between different nets, while still allowing the bonding connector to overhang and reduce overall die size.

Inventive Principle:
Principle #2Taking out (Extraction)

Solution Approach 2:

The notched RDL capture pad acts as an intermediary structure that mediates between the bonding connector and the adjacent die pad. By creating the notch, it provides a transition zone that maintains proper electrical isolation while enabling the compact overhang configuration.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Reliability

If conventional clearance design rules are maintained, then electrical isolation between nets is ensured, but the number of bonding connectors that can be fitted on the die is limited

Engineering Contradiction:
Improveelectrical isolation between netsVSAvoidnumber of bonding connectors
Core Design Contradiction:
ReliabilityVSQuantity of substance

Solution Approach 1:

Instead of maintaining conventional clearance rules that prevent overhang, the invention inverts the approach by deliberately designing the RDL capture pad with a notch that enables and controls the overhang configuration. This inversion of the traditional clearance concept allows bonding connectors to extend beyond the RDL capture pad boundary while maintaining electrical isolation through the notched geometry.

Inventive Principle:
Principle #13The other way round (Inversion)

Data Source

PatentUS8269348B2IC die including RDL capture pads with notch having bonding connectors or its UBM pad over the notch
Publication Date: 2012.09.18 TEXAS INSTRUMENTS INC
  • US8269348B2 patent drawing
  • US8269348B2 patent drawing
  • US8269348B2 patent drawing

AI summary

An IC die includes active circuitry and I/O nodes tied together in first net and at least a second net. A first die pad and a second die pad adjacent thereto are coupled to the first and second net, respectively. A redirect layer (RDL) coupled to the die pads over a first dielectric vias includes a first RDL trace lateral coupling the first die pad and first RDL pad and a second RDL trace coupling the second die pad and second RDL pad. The first RDL pad includes an RDL notch facing the second RDL trace. Under bump metallization (UBM) pads on a second dielectric include a first UBM pad coupled to the first RDL pad over a second dielectric via. A first metal bonding connector is on the first UBM pad. The first UBM pad or first metal bonding connector overhangs the first RDL pad over the notch.