Non-Volatile Memory Dummy Read Heating at Low Temperature
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Solution Overview
Problem
Non-volatile memory devices experience errors when reading or storing data at low temperatures due to changes in threshold voltage distribution, necessitating an operation for heating.
Innovation Solution
A storage device and its operating method that include a storage controller and a non-volatile memory device with a temperature sensor, where the controller performs a dummy read operation to heat the memory device when the temperature falls below a threshold.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of energy
If the non-volatile memory device operates at low temperature, then energy consumption is reduced, but data errors occur due to threshold voltage distribution changes
Solution Approach 1:
The system performs a dummy read operation before actual data operations when the temperature is below a threshold value. This preliminary heating action ensures the memory device reaches a safe operating temperature before critical data operations occur, preventing data errors due to threshold voltage distribution changes at low temperatures.
Solution Approach 2:
The memory device uses its own internal operations (dummy read) to generate the necessary heat for warming itself. The dummy read operation consumes power and generates heat that raises the device temperature to an acceptable level, allowing the device to self-heal the temperature-related reliability issue without external intervention.
2Reliability
If a dummy read operation is performed to heat the memory device, then data reliability at low temperature is improved, but additional operation time is consumed
Solution Approach 1:
The dummy read operation is performed as a preliminary step before actual data read/write operations when the temperature is below the threshold. By conducting this heating operation in advance, the system ensures data reliability for subsequent operations without needing to interrupt normal operations for heating, thus minimizing overall time loss.
Solution Approach 2:
The system continuously monitors the temperature of the non-volatile memory device and uses this feedback to determine when to perform the dummy read operation. The operation is triggered only when the temperature falls below a predetermined threshold, ensuring heating occurs only when necessary and avoiding unnecessary operations that would consume time.
3Reliability
If the storage controller continuously monitors temperature and performs heating operations, then data reliability is maintained, but device complexity increases
Solution Approach 1:
The storage controller monitors the temperature of the non-volatile memory device and uses this feedback information to control when the dummy read operation should be performed. The controller compares the measured temperature against a predetermined threshold and only triggers heating operations when the temperature is below the threshold, creating a simple feedback-based control mechanism that maintains reliability without excessive complexity.
Solution Approach 2:
The memory device has an integrated temperature sensor that automatically detects its own temperature and provides this information to the storage controller. The device essentially monitors and reports its own thermal state without requiring external monitoring systems, simplifying the overall control architecture while maintaining reliable operation.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The dummy read operation efficiently increases the temperature of the non-volatile memory device, reducing data errors and ensuring reliable operation at low temperatures.
Implementation Method 1
performing, by the non-volatile memory device, the dummy read operation for heating
Data Source
AI summary
An operating method of a storage device includes a storage controller and a non-volatile memory device. The method includes providing, by the storage controller, the non-volatile memory device with a first command indicating a temperature read operation, providing, by a temperature sensor of the non-volatile memory device, a first measurement temperature value to the storage controller based on the first command, determining, by the storage controller, whether the first measurement temperature value is lower than a first threshold value, providing, by the storage controller, the non-volatile memory device with a second command indicating a dummy read operation in response to determining that the first measurement temperature value is smaller than the first threshold value, and performing, by the non-volatile memory device, the dummy read operation for heating based on the second command.