Offset Guide Plate Probe Head for Optical Inspection Alignment
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Solution Overview
Problem
Existing connecting devices for inspecting optical semiconductor elements face challenges in easily replacing and aligning optical probes, particularly when a large number of probes are involved, due to complex configurations and alignment requirements.
Innovation Solution
A connecting device with a probe head featuring guide plates with offset penetration holes, allowing for easy insertion and holding of optical probes through an offset arrangement, facilitating alignment and replacement by shifting the central axis positions of the guide plates in the radial direction.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If optical probes are connected using a conventional aligning method, then alignment precision can be achieved, but the alignment process becomes time-consuming and complex
Solution Approach 1:
The guide plates are pre-positioned with penetration holes at predetermined positions before the optical probes are inserted. This preliminary positioning action eliminates the need for time-consuming alignment adjustments during probe installation, as the probes automatically align with the pre-established guide plate positions
Solution Approach 2:
Guide plates are introduced as intermediary components between the probe holder and optical probes. These guide plates serve as mediators that establish precise positional relationships through their penetration holes, eliminating the need for direct complex alignment operations between multiple probes
2Productivity
If a large number of optical probes are used for inspection, then inspection capability is improved, but the complexity of aligning and replacing probes increases
Solution Approach 1:
The probe holder is divided into multiple guide plates, each responsible for positioning specific optical probes. This segmentation allows independent positioning and replacement of individual probes or small groups of probes, reducing the overall complexity of managing large numbers of probes
Solution Approach 2:
Guide plates serve as intermediary components that simplify the management of multiple optical probes by providing predetermined positioning structures. Each guide plate independently manages specific probes, reducing the complexity of aligning and replacing large numbers of probes
3Reliability
If optical probes require frequent replacement due to damage or deterioration, then inspection accuracy is maintained, but maintenance time increases
Solution Approach 1:
The guide plates are pre-positioned with penetration holes that automatically guide optical probes into correct positions during insertion. This preliminary positioning action allows rapid replacement of probes without time-consuming alignment adjustments, maintaining inspection accuracy while reducing maintenance time
Solution Approach 2:
The guide plates provide self-aligning functionality through their penetration holes, automatically positioning optical probes correctly upon insertion without requiring external alignment tools or complex adjustment procedures. This self-service mechanism accelerates the probe replacement process
Data Source
AI summary
A connecting device for inspection includes optical probes, and a probe head including a plurality of guide plates. The probe head includes a first guide plate, and a second guide plate arranged movably with respect to the first guide plate in a radial direction of the penetration holes in a state in which the optical probes are inserted to the respective penetration holes. The probe head holds the optical probes by inner wall surfaces of the penetration holes of the first guide plate and inner wall surfaces of the penetration holes of the second guide plate in a state in which the positions of the central axes of the penetration holes of the first guide plate are shifted in the radial direction from the positions of the central axes of the penetration holes of the second guide plate.