OLED Dam-Over-Power-Wire Layout for Encapsulation Quality
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The quality of the thin film encapsulation layer in display apparatuses, such as organic light-emitting diode displays, affects the display quality and touch screen performance, and existing manufacturing methods do not adequately ensure the proper formation and spread of the organic layer for optimal encapsulation.
Innovation Solution
A display apparatus structure featuring a base substrate with defined display and non-display areas, including a first via insulating layer, power supply wires, dams, and stacked structures, where the organic layer is formed to overlap the stacked structures and dams, and a method involving a thin film transistor layer, via insulating layers, and organic material spreading inspection to ensure improved encapsulation quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the organic layer is formed to overlap the stacked structures and dams, then the thin film encapsulation layer quality is improved, but the device structure becomes more complex
Solution Approach 1:
The patent divides the encapsulation structure into multiple segments: stacked structures (comprising insulating layers and conductive layers) and separate dam structures. This segmentation allows the organic layer to be formed in a controlled manner over each segment, ensuring complete coverage and improving encapsulation quality while maintaining manageable structural complexity through modular design
Solution Approach 2:
The stacked structures and dams are formed in advance before the organic layer deposition. This preliminary action ensures that the organic layer has a predefined path and area to overlap, guaranteeing proper encapsulation formation without requiring complex real-time control during the organic layer formation process
2Manufacturing precision
If the organic layer spread is inspected based on stacked structure visibility, then the manufacturing precision is improved, but the inspection process becomes more complex
Solution Approach 1:
The stacked structures serve as an intermediary reference object for inspection. By designing the stacked structures with specific visibility characteristics, they act as a mediator between the organic layer formation process and the inspection system, enabling precise measurement of organic layer spread without requiring complex direct measurement techniques
Solution Approach 2:
The inspection method utilizes visibility changes (analogous to color changes) of the stacked structure outer periphery. When the organic layer properly covers the stacked structures, the visibility of the stacked structure boundaries changes, providing a simple visual indicator for quality inspection
Data Source
AI summary
A display apparatus includes a base substrate on which a display area and a non-display area are defined, a first via insulating layer on the base substrate, a first power supply wire in the non-display area on the first via insulating layer, a second power supply wire in the non-display area on the first via insulating layer spaced apart from the first power supply wire, a first dam on the base substrate, overlapping the first and second power supply wires, and extending along the non-display area, a first stacked structure on the first via insulating layer between the first dam and the display area, and having a height less than a height of the first dam, and an organic layer on the first stacked structure and the first dam to overlap a substantially entire portion of the first stacked structure and at least a portion of the first dam.