OLED Array Substrate Repair via Power-Line Impurity Ablation

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Solution Overview

Problem

OLED display devices suffer from dark and bright spot defects due to residual impurities causing short circuits between the anode and cathode, which conventional repair methods either damage surrounding areas or affect the aperture ratio.

Innovation Solution

An OLED array substrate design where the anode or cathode is directly connected to the power line, allowing a high voltage to generate a large current that ablates conductive impurities, restoring normal operation without damaging surrounding circuits.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If conventional laser method is used to remove impurities from short circuited region, then dark spot defect is repaired, but surrounding display region is damaged

Engineering Contradiction:
Improvedark spot defect repairVSAvoiddamage to surrounding display region
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

The patent introduces a connection component as an intermediary element between the first electrode and the power line. This component can be selectively connected or disconnected through laser irradiation, allowing controlled current flow to repair dark spot defects without directly irradiating and damaging the surrounding display region. The connection component acts as a mediator that enables targeted repair while protecting adjacent areas.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If backup line is made on array substrate to repair bright spot defect, then bright spot defect is eliminated, but wiring space is occupied and aperture ratio is affected

Engineering Contradiction:
Improvebright spot defect repairVSAvoidaperture ratio
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

The connection component serves multiple functions: it can be used during normal operation to provide electrical connection, and during repair operations, it can be selectively disconnected to eliminate bright spot defects. This multi-functional design eliminates the need for separate backup wiring structures, thereby avoiding occupation of additional wiring space and preserving the aperture ratio.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Reliability

If data line is cut off and TFT is welded to constant potential to repair bright spot defect, then bright spot defect is eliminated, but repair process becomes complex and wiring space is occupied

Engineering Contradiction:
Improvebright spot defect repairVSAvoidrepair process complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent extracts the repair functionality into a dedicated connection component that can be independently controlled. By cutting the connection component rather than the data line, and welding the TFT to constant potential, the repair process becomes more straightforward. The connection component is specifically designed for repair operations, separating the repair function from the normal signal transmission function, thereby simplifying the overall repair process.

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Effectively repairs dark spots by isolating the first electrode from the power line, maintaining the integrity of surrounding circuits and aperture ratio, and simplifies the repair process.

Implementation Method 1

a high voltage is applied to the power line, so that an instantaneous large current is generated between the first electrode and the second electrode

Methodology Applied
Scientific EffectJoule heating: Joule Heating

Implementation Method 2

The large current flows through the conductive impurities between the first electrode and the second electrode and ablates the conductive impurities

Methodology Applied
Scientific EffectLaser ablation: Laser Ablation

Data Source

PatentEP3565003B1Dark spot fixing method for an OLED array substrate
Publication Date: 2023.12.20 BOE TECHNOLOGY GROUP CO LTD
  • EP3565003B1 patent drawingFigure 1~3
  • EP3565003B1 patent drawingFigure 4a~4c
  • EP3565003B1 patent drawingFigure 4d~5

AI summary

An organic light-emitting diode (OLED) array substrate, a display apparatus and a method for repairing a dark spot of the display apparatus or the OLED array substrate are provided by the embodiments of the present disclosure. The OLED array substrate includes: power lines (202), a connection component, a pixel structure (205) disposed in a pixel region, and the pixel structure (205) includes a driving transistor (207), and an OLED device (208). The OLED device includes a first electrode (211) and a second electrode (212), and the first electrode (211) is electrically connected with the first source/drain electrode (209) of the driving transistor (207); the connection component (213) is configured to electrically insulating the first electrode (211) from the power lines (202) before repairing the OLED array substrate; and the connection component (213) is further configured to electrically connect the first electrode (211) (anode or cathode) with the power lines (202) in a case of repairing the OLED array substrate. The first electrode (211) (anode or cathode) of the OLED device is electrically connected with the power line (202) by the connection component in the present disclosure, and then the conductive impurities between the anode and the cathode of the OLED device (208) is melt, then performing a dark spot repairing on the display apparatus, the dark spot repairing method has the advantages of simple operation, and no adverse impact on the surrounding circuits.