OLED Charge Generation Layer Doping for Lower Driving Voltage

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Solution Overview

Problem

Current organic light emitting display devices using a P-type charge generation layer formed solely of HAT(CN)6 suffer from inefficient hole generation and injection, leading to increased driving voltage and reduced lifespan.

Innovation Solution

Doping the P-type charge generation layer with 1% to 20% of a hole transport material improves hole generation and injection, reducing driving voltage and increasing lifespan.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If the P-type charge generation layer is formed solely of HAT(CN)6, then the device structure is simple, but hole generation and injection are inefficient leading to increased driving voltage and reduced lifespan

Engineering Contradiction:
Improvecharge generation layer structureVSAvoiddevice lifespan
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The P-type charge generation layer is formed as a composite material by doping HAT(CN)6 with a hole transport material (such as TPD, NPB, or TCTA) at a concentration of 1% to 20% by volume. This composite structure combines the charge generation capability of HAT(CN)6 with the hole transport properties of the dopant material, thereby improving hole generation and injection efficiency without significantly increasing device complexity

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The doping concentration of the hole transport material in the P-type charge generation layer is optimized within the range of 1% to 20% by volume. This parameter optimization balances the competing requirements of improving hole transport efficiency while maintaining the charge generation properties of HAT(CN)6 and avoiding excessive device complexity

Inventive Principle:
Principle #35Parameter changes

2Ease of manufacture

If the P-type charge generation layer is formed solely of HAT(CN)6, then the manufacturing process is simple, but the driving voltage is increased due to inefficient hole generation

Engineering Contradiction:
Improvecharge generation layer fabricationVSAvoiddriving voltage
Core Design Contradiction:
Ease of manufactureVSPower

Solution Approach 1:

The P-type charge generation layer uses a composite formulation of HAT(CN)6 doped with hole transport material, which maintains compatibility with existing vacuum deposition and solution processing techniques while improving hole generation efficiency and reducing driving voltage requirements

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

By optimizing the doping concentration parameter within 1% to 20% by volume, the device achieves reduced driving voltage through improved hole transport, while the doping process remains compatible with standard manufacturing techniques requiring minimal process modification

Inventive Principle:
Principle #35Parameter changes

3Productivity

If the P-type charge generation layer is doped with hole transport material, then hole injection efficiency is improved, but the device complexity increases

Engineering Contradiction:
Improvehole injection efficiencyVSAvoidcharge generation layer composition
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The P-type charge generation layer incorporates a composite material system where HAT(CN)6 serves as the host material and the hole transport material (TPD, NPB, or TCTA) acts as the dopant. This composite approach enhances hole injection efficiency by leveraging the superior hole transport properties of the dopant while maintaining the charge generation functionality of HAT(CN)6

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The hole transport material is selectively introduced into the P-type charge generation layer at a controlled concentration of 1% to 20% by volume, creating localized enhancement of hole transport properties precisely where needed without affecting other device components or requiring complex structural modifications

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The doping of the P-type charge generation layer with a hole transport material results in a decrease in driving voltage by 0.7 V to 0.9 V and an increase in lifespan by 6% to 23% compared to devices without doping.

Implementation Method 1

The P-type charge generation layer is doped with 1% to 20% of a hole transport material based on a volume of the P-type charge generation layer

Methodology Applied
Scientific EffectDoping: Dopants

Implementation Method 2

the P-type charge generation layer generates holes and electrons, injects the electrons into the N-type charge generation layer, and injects the holes into the hole transport layer of the second stack

Methodology Applied
Scientific EffectCharge injection:

Data Source

PatentUSRE50440E1Organic light emitting display device
Publication Date: 2025.05.20 LG DISPLAY CO LTD
  • USRE50440E1 patent drawing
  • USRE50440E1 patent drawing
  • USRE50440E1 patent drawing

AI summary

An organic light emitting display device includes a first electrode and a second electrode disposed on a substrate opposite to each other, a first stack including a hole injection layer, a first hole transport layer, a first light emitting layer, and a first electron transport layer sequentially stacked on the first electrode, a second stack including a second hole transport layer, a second light emitting layer, and a second electron transport layer sequentially stacked between the first stack and the second electrode, and a charge generation layer disposed between the first stack and the second stack and including an N-type charge generation layer and a P-type charge generation layer to control charge balance between the first and second stacks. The P-type charge generation layer is doped with 1% to 20% of a hole transport material based on a volume of the P-type charge generation layer.