On-Chip Interferometry for EDOF Imaging
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Solution Overview
Problem
Current extended depth of field (EDOF) systems are slow and require significant post-processing to produce high-resolution, in-focus, true color images, often limited by artifacts, processing speed, and the need for off-chip data transfer.
Innovation Solution
An on-chip processing method combining interferometry and imaging using a pixel-array sensor with integrated CMOS devices, allowing for real-time processing of interference fringes and reducing the need for off-chip data transfer, thereby enhancing image acquisition speed and quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple images and significant post-processing are used to create fully in-focus images, then image quality and resolution are improved, but processing time and system speed deteriorate
Solution Approach 1:
The patent applies preliminary action by performing focus metric calculation and image fusion operations during the image acquisition phase rather than as separate post-processing steps. The processor calculates focus metrics and fuses images concurrently with data collection, eliminating the need for significant post-processing and thereby improving processing speed while maintaining image quality
Solution Approach 2:
The system maintains continuity of useful action by processing images in real-time as they are captured. The processor continuously calculates focus metrics and performs image fusion without interruption, creating a seamless workflow that improves processing speed while ensuring high-resolution output through continuous optimization
2Adaptability or versatility
If off-chip processing is used for image data, then processing flexibility is improved, but data transfer time and system efficiency deteriorate
Solution Approach 1:
The patent merges the processing functions with the sensor chip by integrating the processor directly with the image sensor. This on-chip integration allows focus metric calculation and image fusion to occur immediately at the source, eliminating data transfer time while maintaining processing flexibility through dedicated processing circuits designed for specific operations
3Measurement precision
If white light interferometry is used to acquire true color images, then color accuracy is improved, but system operation speed deteriorates
Solution Approach 1:
The system applies preliminary action by extracting color information during the interferometric scanning process rather than as a separate operation. The processor identifies fringe patterns and extracts color data concurrently with depth measurement, enabling true color image acquisition without slowing down the scanning process
Solution Approach 2:
The system maintains continuity by performing color extraction and depth measurement simultaneously throughout the scanning process. The processor continuously analyzes interference fringes to obtain both geometric and color information in real-time, eliminating sequential operations and improving overall system speed while preserving color accuracy
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables the creation of high-speed, artifact-free, in-focus, true color images with reduced processing requirements, improving the efficiency and accuracy of EDOF systems for capturing detailed three-dimensional objects.
Implementation Method 1
detecting interference fringes from the scene at a plurality of scan depths by a pixel-array sensor
Data Source
AI summary
Method and system for on-chip processing to obtain an EDOF image combines interferometry and imaging so the two operations do not interfere with one another but, rather, work together to create an in-focus, true color image of a three-dimensional object. This image has no significant artifacts and requires only limited processing. In addition, a coarse depth map is created in the process which may also be helpful in subsequent usage of the acquired image. A CMOS pixel-array sensor includes circuitry to implement processing at the pixel level.