An optical coherence tomography apparatus splits light into multiple measurement channels for simultaneous scanning across separate spectroscopes.
A lithographic apparatus detects radiation intensity reflected from composite gratings to determine substrate displacement relative to an imprint template.
A silicon photonic chip integrates wavelength multiplexers and light guides to build a compact spectrometer.
A spectroscopic instrument routes split light to sensor elements arranged for wavenumber-linear intensity registration.
Segmenting tear film layers and applying preliminary action reduces calculation time from minutes to seconds while maintaining measurement precision.
A multi-functioned optical measurement device integrates interferometry, confocal microscopy, and ellipsometry into a single unified system.
A light measurement device adjusts optical axis alignment using phase-changing and phase-fixing units to maintain high precision.
A pixel-array sensor processes interference fringes on-chip to generate in-focus images.
A photodetector calibration method uses an optical element with known wavenumber characteristics to adjust light intensity for output correction.
Stacked random metasurfaces form speckle patterns on a pixelated sensor, resolving the trade-off between high-resolution imaging and rapid measurement time.
Fourier transform infrared spectrometer uses carbon dioxide absorption peaks to calibrate semiconductor laser oscillation wavelengths.
A tilted mirror Fabry-Perot cavity enables precise spectral resolution control through electrostatic actuation of a deformable spacer.
An elastic light module mounts optical elements via deformable support portions to secure positioning within a base opening.