On-Chip Thermal Sensor Circuit Without External Reference Clock
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Solution Overview
Problem
Semiconductor devices operating at high speeds generate excessive heat, leading to performance and reliability issues when temperature exceeds specified ranges, and existing methods for monitoring temperature require an external reference clock generator, making the process cumbersome and inconvenient.
Innovation Solution
A semiconductor device with an embedded thermal sensor that generates a temperature-dependent current, utilizing a counter to generate a chop signal for the current mismatch correction and voltage offset correction circuits, allowing for accurate temperature monitoring without an external reference clock generator.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If high-speed operation is implemented, then processing speed is improved, but heat generation increases causing temperature to exceed specified ranges
Solution Approach 1:
The semiconductor device monitors its own temperature using an embedded thermal sensor and internal counter circuitry, eliminating the need for external monitoring equipment. The device serves itself by generating temperature-dependent current and processing it through integrated counters to detect temperature conditions.
Solution Approach 2:
The patent utilizes temperature-dependent current generation where electrical current parameters change in response to temperature variations. The counter circuitry detects these parameter changes by comparing current values at different temperatures to determine when temperature exceeds specified ranges.
2Measurement precision
If external reference clock generator is used for temperature monitoring, then temperature measurement capability is improved, but device complexity and convenience deteriorate
Solution Approach 1:
The patent combines the temperature sensor, current generation circuitry, counter logic, and temperature evaluation functions into a single integrated semiconductor device. The counter is embedded within the device alongside the thermal sensor, merging what would traditionally be separate external components into one unified system.
Solution Approach 2:
The counter circuitry serves multiple functions: it counts clock pulses for time measurement, detects temperature-dependent current variations, and determines when temperature exceeds specified ranges. This multi-functional approach eliminates the need for dedicated external temperature monitoring equipment.
3Measurement precision
If external reference clock generator is used for temperature monitoring, then temperature measurement capability is improved, but ease of operation deteriorates
Solution Approach 1:
The semiconductor device monitors its own temperature using an embedded thermal sensor and internal counter circuitry, eliminating the need for external monitoring equipment. The device serves itself by generating temperature-dependent current and processing it through integrated counters to detect temperature conditions.
Solution Approach 2:
The patent combines the temperature sensor, current generation circuitry, counter logic, and temperature evaluation functions into a single integrated semiconductor device. The counter is embedded within the device alongside the thermal sensor, merging what would traditionally be separate external components into one unified system.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate and convenient temperature monitoring within the semiconductor device, reducing the need for external components and improving reliability by generating a precise temperature-dependent current.
Implementation Method 1
A thermal sensor that detects temperature and that generates a temperature-dependent current dependent of, i.e., that varies with, temperature may be embedded in a semiconductor device
Data Source
AI summary
A semiconductor device includes a temperature-independent current generator that generates a reference current substantially independent of temperature and a mirror current that is a substantial duplicate of the reference current, a pulse signal generator that samples the mirror current so as to generate a pulse signal, and a counter that obtains a number of pulse signals generated by the pulse signal generator, that permits the pulse signal generator to generate a pulse signal when it is determined thereby that the number of pulse signals obtained thereby is less than a predetermined threshold value, and that inhibits the pulse signal generator from generating a pulse signal when it is determined thereby that the number of pulse signals obtained thereby is equal to the predetermined threshold value. A method for monitoring a temperature of the semiconductor device is also disclosed.