On-Die Jitter Generator for IC Testing

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Solution Overview

Problem

Conventional jitter generators are expensive and difficult to use for testing integrated circuits (ICs) on system boards due to the need for specialized test and measurement equipment and impedance matched connectors.

Innovation Solution

An integrated circuit (IC) with an integral jitter generator that produces non-intrinsic jitter for testing jitter tolerance and other characteristics, eliminating the need for external test equipment and allowing field testing without special connectors.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional test and measurement equipment devices are used to test ICs, then measurement precision is improved, but device complexity and cost increase

Engineering Contradiction:

Improvejitter measurement precisionVSAvoidtest equipment complexity

Core Design Contradiction:

Measurement precisionVSDevice complexity

Solution Approach 1:

The jitter generator is merged with the IC under test, integrating the testing function directly into the device being tested. This eliminates the need for separate external test equipment and reduces overall system complexity while maintaining measurement precision through on-die testing capabilities.

Inventive Principle:

Principle #5Merging (Combining)

Solution Approach 2:

The IC tests itself by incorporating a jitter generator that can inject jitter signals into the IC's own signal paths. This self-testing capability eliminates dependence on external sophisticated test equipment, reducing both complexity and cost while maintaining accurate jitter measurement.

Inventive Principle:

Principle #25Self-service

2Measurement precision

If conventional test and measurement equipment devices are used to test ICs on system boards, then measurement precision is improved, but ease of operation deteriorates due to special connectors

Engineering Contradiction:

Improvejitter measurement precisionVSAvoidfield testing ease

Core Design Contradiction:

Measurement precisionVSEase of operation

Solution Approach 1:

The jitter generator is integrated within the IC package, allowing the IC to generate and inject jitter signals directly into its own signal paths without requiring external connectors. This merging of testing functionality into the IC itself enables straightforward field testing on system boards using standard interfaces.

Inventive Principle:

Principle #5Merging (Combining)

3Ease of operation

If integral jitter generator is added to the IC, then ease of operation is improved for field testing, but device complexity increases

Engineering Contradiction:

Improvefield testing easeVSAvoidIC structure complexity

Core Design Contradiction:

Ease of operationVSDevice complexity

Solution Approach 1:

The integrated jitter generator serves multiple functions: it can generate jitter signals for self-testing, inject jitter into signal paths for tolerance testing, and work with various test scenarios. This multi-functionality justifies the added complexity by providing versatile testing capabilities within a single integrated component.

Inventive Principle:

Principle #6Universality (Multi-functionality)

Data Source

PatentUS9222972B1On-die jitter generator

Publication Date: 2015.12.29 ALTERA CORP

AI summary

An IC that includes a jitter generator, where the jitter generator is integral with the IC and generates non-intrinsic jitter, is provided. In one implementation, the non-intrinsic jitter is used to measure a characteristic of the IC. In one implementation, the non-intrinsic jitter is used to test jitter tolerance of the IC. In yet another implementation, the non-intrinsic jitter is used to test another IC coupled to the IC that includes the jitter generator.