Digital Circuit Testing TRIZ Cases

An FPGA system uses an interconnect structure to transmit configuration parameters simultaneously, enabling rapid dynamic reconfiguration.

A test access port circuit uses a controller to manage multiple register sets for parallel data input and output operations.

Integrating a jitter generator inside the IC eliminates expensive external test equipment and specialized connectors.

An error rate measuring apparatus divides symbol string data into most significant bit and least significant bit components for parallel display.