Optical Device Spectral Response Tuning via Reference Matching
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Solution Overview
Problem
Existing optical device observation techniques are excessively complex both computationally and structurally, leading to inefficient and time-consuming processes for tuning, monitoring, and testing.
Innovation Solution
An optical system comprising an optical reference device and a device to be observed, where the system operates by using electromagnetic radiation to tune and control the optical device through a controller that adjusts actuators to match the spectral response of a reference device, minimizing computational complexity and structural complexity while ensuring accuracy and efficiency.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If full spectrum measurement is used for observing optical devices, then measurement precision is improved, but device complexity and observing time increase excessively
Solution Approach 1:
The patent extracts only the essential spectral characteristics needed for device observation rather than measuring the complete spectrum. By identifying and measuring only the critical wavelength regions that define device performance, the system achieves necessary measurement precision while dramatically reducing computational and structural complexity.
Solution Approach 2:
Instead of performing complete spectrum measurement (excessive action), the patent applies partial measurement by focusing only on specific spectral regions that are sufficient for device characterization. This partial action approach maintains adequate measurement precision for practical purposes while avoiding the excessive complexity of full-spectrum analysis.
2Measurement precision
If full spectrum measurement is used for observing optical devices, then measurement precision is improved, but observing time increases excessively
Solution Approach 1:
The patent extracts only the essential spectral information required for device observation, measuring only critical wavelength regions rather than the entire spectrum. This extraction approach maintains sufficient measurement precision while significantly reducing the time required for observation.
Solution Approach 2:
The patent skips unnecessary spectral regions that do not contribute meaningfully to device characterization. By rushing through the measurement process and focusing only on essential spectral features, the system achieves adequate precision with minimal observing time.
3Measurement precision
If conventional observation techniques are used, then spectral response can be measured, but computational complexity becomes excessive
Solution Approach 1:
The patent extracts only the essential spectral parameters needed for device observation, avoiding computation of the complete spectral response. By calculating only the critical wavelength regions that define device performance, the system maintains measurement capability while dramatically reducing computational complexity.
Solution Approach 2:
Instead of performing complete spectral analysis (excessive computation), the patent applies partial computation by calculating only the essential spectral features. This partial computational approach maintains sufficient measurement precision while avoiding excessive computational burden.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system allows for simpler, faster, and more accurate tuning, monitoring, and testing of optical devices by avoiding the need for full spectrum measurement, significantly reducing observing time and improving operational efficiency.
Implementation Method 1
solutions of known art are based on the measurement of the spectral response of the device which is compared with a reference spectral mask
Data Source
AI summary
An optical system may include an optical radiation source, an optical device, an optical reference device, an optical detector, and a processing module. The optical radiation source may provide an optical input signal. The optical device may provide one or more of a first band-pass output associated a first band-pass wavelength response and a first band-stop output associated with a first band-stop wavelength response. The optical reference device may provide one or more of a second band-pass output associated with a second band-pass wavelength response and a second band-stop output associated with a second band-stop wavelength response. The optical devices may be coupled together and may provide an optical output signal. The optical detector may convert the optical output signal into an electrical measurement signal. The processing module may evaluate deviations between the band-pass responses and the band-stop responses.