Optical Inspection Device Using Collimator and Mirror for Chart Projection
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Solution Overview
Problem
Conventional optical inspection devices are restricted by the distance to the chart when inspecting optical systems, limiting their ability to effectively assess wide-angle lenses and requiring frequent chart changes for different optical systems.
Innovation Solution
An optical inspection device that projects light rays onto both the center and periphery of an image sensor using a collimating lens and mirrors, allowing for adjustable incident angles and reducing the dependency on chart size and distance, enabling inspection without distance restrictions and using a unified chart for various optical systems.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a conventional optical inspection device uses a mirror to reflect a chart onto an image sensor through the lens under inspection, then the optical performance can be measured, but the distance to the chart is restricted
Solution Approach 1:
The patent introduces a beam splitter and multiple mirrors to create multiple optical paths, transforming the single-axis measurement into a multi-dimensional measurement system. This allows light to travel along different paths (direct path and reflected path) to reach the image sensor, effectively removing the distance restriction while maintaining measurement precision
Solution Approach 2:
The beam splitter acts as an intermediary element that divides the light from the chart into multiple paths. By introducing this intermediary component, the system can simultaneously create both direct and reflected light paths, enabling the chart to be positioned at greater distances while still achieving accurate optical performance measurement
2Measurement precision
If different optical systems require different chart distances and positions, then accurate inspection can be performed, but frequent chart changes are required
Solution Approach 1:
The patent creates a universal inspection system where a single chart can be used for multiple different optical systems. By implementing multiple optical paths with beam splitters and mirrors, the system can adapt to various lens types (wide-angle, telephoto, etc.) without requiring different charts, thus improving inspection efficiency while maintaining accuracy
3Device complexity
If a single optical path is used for imaging, then the device structure is simple, but the distance to the chart is restricted and versatility is limited
Solution Approach 1:
The patent segments the optical path into multiple independent paths using beam splitters and mirrors. Instead of using a single complex optical path, the system divides the light into separate paths (direct and reflected), each of which can be independently optimized. This segmentation approach maintains relative structural simplicity while significantly improving versatility and removing distance restrictions
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution allows for accurate inspection of optical systems without distance limitations, improves inspection accuracy by minimizing distortion effects, and simplifies the process by using a single chart for multiple optical systems, reducing the need for frequent chart changes.
Implementation Method 1
a collimating lens 103. The collimator 103 includes the collimating lens 103
Implementation Method 2
a mirror 111. The reflection unit 110 includes the mirror 111. the mirror 111 reflects light rays delivered to the mirror 111 among the on-axis light rays
Data Source
Figure 1
Figure 2A~2B
Figure 3
AI summary
An optical inspection device (100) comprises: an LED (102); a chart (102); a collimator (103); and a mirror (111). The LED (101) irradiates the chart (102) with light to deliver light rays to the collimator (103) as on-axis light rays. This allows a pattern on the chart (102) to be projected onto a center of an image sensor (130) through the collimator (103) and an optical system under inspection (120). The mirror (111) reflects light rays delivered to the mirror (111) through the collimator (103) among the on-axis light rays. This allows the pattern on the chart (102) to be projected onto a periphery of the image sensor (130) through the optical system under inspection (120).