Optical Semiconductor Lead-Terminal Alignment With Electrode Inspection
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Solution Overview
Problem
Existing inspection devices struggle to perform lead correction and electrical inspection on optical semiconductor devices with a large number of lead terminals, especially when the terminals are deformed, as comb teeth structures fail to intersect properly and can damage the terminals.
Innovation Solution
An inspection device with blocks and wires that sandwich and correct the positions of lead terminals, using electrodes for electrical inspection, allowing for flexible adjustment based on the number of terminals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If comb teeth are used to correct lead terminal positions, then lead correction can be performed, but the comb teeth cannot intersect properly when the number of lead terminals is great and they are arranged in a complex manner
Solution Approach 1:
The inspection device is divided into multiple independent blocks, each capable of independently positioning and correcting lead terminals. Each block can be controlled separately to handle specific regions of the lead terminal array, allowing complex arrangements to be managed through modular segmentation without requiring a single complex comb tooth structure.
Solution Approach 2:
The invention transitions from a single-plane comb tooth structure to a three-dimensional configuration where blocks can move in multiple dimensions (vertical and horizontal directions). This allows the blocks to approach lead terminals from different angles and positions, enabling proper contact and correction even when lead terminals are arranged in complex patterns that would prevent comb teeth from intersecting.
2Ease of operation
If comb teeth are used for lead correction, then lead correction can be performed, but the comb tooth does not include an electrode for inspection so it cannot perform electrical inspection
Solution Approach 1:
The invention merges the lead correction function and electrical inspection function into a single integrated block structure. Each block contains both the mechanical correction capability (through its positioning system) and the electrical inspection capability (through integrated electrodes), allowing one structure to perform multiple functions simultaneously rather than requiring separate comb teeth for correction and separate electrodes for inspection.
Solution Approach 2:
The blocks are designed as universal components that can perform both lead terminal correction and electrical inspection. The same block structure that mechanically positions and corrects deformed lead terminals also houses electrodes that can make electrical contact with the lead terminals, making the inspection device versatile enough to handle both correction and inspection tasks with a single integrated system.
3Ease of operation
If comb teeth are used to correct lead terminals, then lead correction can be performed, but when a lead terminal is deformed it may come into contact with the comb tooth and the lead terminal may be damaged
Solution Approach 1:
The invention incorporates cushioning elements or compliant features in the block structure that can absorb impact and prevent damage to lead terminals during the correction process. Before contact occurs, the cushioning mechanism can deform or compress to absorb the energy of deformed lead terminals, preventing them from being damaged by rigid comb teeth while still achieving the correction function.
Solution Approach 2:
The block structure serves as an intermediary between the correction mechanism and the lead terminals. Rather than using direct comb teeth that could damage deformed terminals, the blocks act as a mediating structure that can gently grasp and position lead terminals, absorbing the harmful effects of deformation while still achieving the correction objective through controlled mechanical interaction.
4Quantity of substance
If the number of lead terminals is great, then the inspection device can handle more terminals, but it becomes difficult to cause comb teeth to intersect each other
Solution Approach 1:
The inspection device is segmented into multiple independent blocks that can be controlled separately. Each block handles a specific portion of the lead terminal array, allowing the system to scale with the number of terminals without requiring a single complex comb tooth structure. This segmentation enables manageable interaction with a large number of terminals while avoiding the intersection problems of traditional comb teeth.
Solution Approach 2:
The invention moves from a two-dimensional comb tooth arrangement to a three-dimensional block configuration that can operate in multiple spatial dimensions. This allows blocks to access and correct lead terminals without requiring intersection of comb teeth, enabling the device to handle greater numbers of terminals arranged in complex patterns by utilizing vertical and horizontal positioning freedom.
Data Source
AI summary
A plurality of electrodes (13) are provided on tip ends of a plurality of blocks (8) respectively. The plurality of lead terminals (3) are sandwiched by the plurality of blocks (8) and the plurality of wires (9) to correct positions of the plurality of lead terminals (3). The plurality of electrodes (13) are brought into contact with the plurality of lead terminals (3) to inspect an electrical characteristic of the optical semiconductor device (1).