Optical Rotation Probe Calibration via Minute Angle Deviation
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Solution Overview
Problem
Existing three-dimensional measurement apparatuses struggle to accurately calibrate the emission direction of measurement light from optical rotation probes, especially when measuring local portions with great curvature, leading to significant measurement errors.
Innovation Solution
A calibration method for optical rotation probes that involves changing the emission direction of measurement light by a minute angle from a reference direction, acquiring shape errors for a reference object, and calculating adjustment errors to recalculate the emission direction accurately.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional calibration methods are used for optical rotation probes, then the calibration process is simple, but the emission direction cannot be calibrated with high accuracy, especially for measuring local portions with great curvature
Solution Approach 1:
The patent applies preliminary action by performing a preliminary calibration to establish an initial emission direction, then intentionally introducing a minute angle deviation from this preliminary calibration. This allows the system to measure and calculate adjustment errors by comparing theoretical shape errors (based on the intentional deviation) with actual measured shape errors, thereby achieving high-accuracy calibration without requiring complex equipment.
Solution Approach 2:
The patent implements feedback by calculating adjustment errors through the comparison between theoretical shape errors (derived from the intentional minute angle change) and actual measured shape errors. This feedback loop enables the system to determine the true emission direction by iteratively correcting for deviations, achieving high calibration accuracy while maintaining process simplicity.
2Measurement precision
If the emission direction is not accurately calibrated, then the calibration process is faster and simpler, but measurement errors become large when measuring local portions with great curvature
Solution Approach 1:
The patent applies parameter changes by introducing a controlled minute angle deviation from the preliminary calibration emission direction. This intentional parameter change enables the calculation of adjustment errors by comparing theoretical and actual shape errors, thereby achieving high measurement accuracy for local portions with great curvature without requiring extensive calibration time.
3Measurement precision
If conventional calibration is used, then the equipment and procedure are simpler, but adjustment errors remain after calibration that affect measurement accuracy
Solution Approach 1:
The patent applies self-service by enabling the calibration system to automatically calculate and correct its own emission direction errors. By measuring shape errors of a reference object at different positions and comparing them with theoretical values, the system self-determines adjustment errors and performs self-correction, achieving high calibration accuracy without requiring external complex equipment or procedures.
Data Source
AI summary
The calibration method includes changing the emission direction of the measurement light to be emitted from the optical rotation probe by a minute angle from a reference direction set in advance, acquiring a shape error for a reference object after changing the emission direction by emitting the measurement light from the optical rotation probe toward the reference object while rotating the emission direction of the measurement light around an S axis and varying a relative position between the optical rotation probe and the reference object, and calculating an adjustment error of the emission direction of the measurement light with respect to the reference direction based on a theoretical value of the shape error for the reference object to be obtained in a case where the emission direction of the measurement light matches the reference direction and a measurement value of the acquired shape error for the reference object.