Using Optical Means TRIZ Cases

A non-contact optical probe uses a spherical reference surface to project curved test wavefronts for precise coordinate measurement.

Segmented light blocking members approach each other to cover the substrate edge, reducing loading time and dust accumulation during exposure.

Phase-shifting shadow moiré system calculates surface topography without damaging transparent objects, eliminating the need for reflective paint application.

An optical transducer measures pressure via light interference, shielding components from thermal stress and mechanical yielding.

A beamsplitter mediates the optical path to display simultaneous target and reflection images, resolving visibility issues in infrared metrology.

A lidar sensor system uses parallax between a linear beam and angled photodetector to determine object attributes.

Mask segments planar light beams into discrete patterns, enabling accurate feature identification on complex surfaces obscured by sealant.

A multi-camera photogrammetry system determines 3D coordinates using fixed reference marks and fringe projection for industrial robot calibration.

A 3D structure sensing system compares image data with depth data to identify reflective surface interference.

A projection exposure tool adapts imaging characteristics using calculated thermal expansion coefficients to stabilize optical properties.

A mobile device accelerometer detects motion to rotate a laser scanner mirror and base axes for remote positioning.

Capacitive sensing measures lift height to interrupt motion data and reduce power consumption without complex optical redesign.

A spacer supports fiber reinforced plastic sheet ends to eliminate hanging and fluffing, ensuring accurate optical space detection.

Reflective patterns on the elongated member compensate for stretching errors, improving motion mechanism precision.

A metrology system uses coherent light beams to determine end tool position and orientation.

Pre-configured laser and lens assembly reduces manual alignment time while maintaining measurement precision.

A sensor element uses a compression spring to guide optical fibers, preventing jamming during tilting movements.

A borescope projects fringe sets with varying phase shifts to compute ripple metrics for object distance determination.

A measurement device identifies reflected light pulse timings using temporal waveform signatures.

An aperture filters transmitted light to create a diffraction pattern, eliminating noise from unwanted reflections and ensuring micron-level accuracy.

A packaging system captures item images to identify specific characteristics and generates tailored instructions for accurate material selection.

A dual laser frequency sweep interferometry system generates a mirrored optical sweep via four-wave mixing using a single tunable laser and fixed pump source.

An interferometer measures oscillating probe height directly to extract sample data without feedback loop delays.

An isotropic thermal expansion carrier mounts the beam splitter and mirror-symmetric pinholes, stabilizing optical paths against temperature changes.

A dual-camera image capture system uses controlled strobe lighting to stabilize illumination during systematic object rotation.

Controller calculates hitch angle offsets using vehicle and trailer yaw rates to extrapolate additional offset values.

A compact beamforming system generates non-orthogonal acoustic beams using a two-dimensional transducer array.

Interferometers align optical wafers by measuring reflector positions, reducing assembly time while maintaining precise lens stack offsets.

A laser scanner adjusts rotation speed to concentrate radiant density in detection areas.

A handheld optical coherence tomography probe scans diverging light onto a curved retinal surface using a 5F relay telescope lens system.

Camera imaging replaces mechanical scanning to measure wire curvature across varying geometries without frequent adjustments.

Captures dynamic sensor vibrations using a high-rate auxiliary system to correct measurement errors and ensure reliable surface analysis.

A micro stepper motor drives an optical sensing unit to determine wheel geometrical dimensions with high resolution.

A laser scanning apparatus adjusts pulse timing to maintain constant swath width during airborne terrain mapping.

A pivoted calibration plane enables interferometric measurement of axial distances between spaced points to determine lateral beam position and direction.

A terahertz measurement apparatus uses coupled wavelength-fixed and swept lasers to generate continuous waves for non-contact thickness analysis.

Automated imaging captures pulsed laser spots on an inspection wafer to replace operator-dependent visual inspection and reduce confirmation time.

Calibrating optical rotation probes by introducing minute angle deviations from reference directions resolves measurement errors on curved surfaces.

A switchable fringe pattern illuminator uses optical path switches to dynamically control light distribution across dual waveguides.

Beam profile reflectometry measures film thickness and surface roughness in through-silicon via structures.

A UV laser system vaporizes coatings from composite surfaces using photoablation to achieve precise surface texture.

A non-contact sensor uses a movable MEMS mirror and fold mirror to scan a Gaussian optical beam for three-dimensional coordinate measurements.

An embedded system generates structured light patterns in real time and synchronizes a camera with a projector to capture 3D images.

A digital feeler gauge uses an optical sensor to detect deployed blades and calculate thickness.

A scanning probe uses a photoluminescent emitter to track stylus displacement via quadrant photodetectors.

A spatial light modulator splits a measurement beam into multiple components for simultaneous target illumination.

Dual lenses with distinct refractive index temperature coefficients stabilize focal length, preventing 3D imaging errors caused by thermal drift.

A position measuring device uses a two-dimensional detector arrangement to scan a grid scale for absolute position signals.