Optical Speckle Measurement Chamber for Rapid Particle Detection
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Solution Overview
Problem
Existing methods for measuring microorganisms, such as microorganism cultivation, mass spectrometry, nuclear magnetic resonance, and optical methods like Raman spectrometry, are time-consuming, require expensive and complex equipment, and are difficult for the general public to access due to the need for professional knowledge and are affected by environmental factors.
Innovation Solution
An optical measuring apparatus with a chamber portion for sample accommodation, light interference, a light source, and a sensor to detect speckles of output light, utilizing polarization units to estimate target particle information.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional methods (cultivation, mass spectrometry, NMR) are used to measure microorganisms, then measurement accuracy is achieved, but measurement time is excessively long and equipment cost is high
Solution Approach 1:
The patent replaces complex mechanical and chemical measurement systems (mass spectrometry, NMR, cultivation) with an optical measurement system that uses light scattering and interference effects. This substitution enables rapid microbial measurement without the time-consuming processes of traditional methods while maintaining measurement capability through optical detection of cellular structures.
Solution Approach 2:
The patent changes the measurement parameter from chemical/physical properties requiring complex equipment to optical properties (light scattering patterns, interference fringes) that can be detected quickly. By measuring optical parameters rather than chemical composition or requiring cell cultivation, the system achieves fast measurement without sacrificing accuracy.
2Productivity
If Raman spectrometry or multispectral imaging is used for optical measurement, then measurement speed improves, but device complexity and operational difficulty increase significantly
Solution Approach 1:
The patent extracts only the essential optical components needed for measurement (light source, simple imaging lens, sensor) while removing complex elements from traditional optical systems. By using basic light scattering and interference phenomena rather than complex spectrometry systems, it achieves fast measurement with minimal optical complexity.
Solution Approach 2:
The patent employs simple, inexpensive optical components that can be easily replaced or adjusted rather than complex, expensive equipment requiring professional operation. The system uses basic optical elements like simple lenses and standard sensors instead of sophisticated spectrometers, making the system accessible and easy to operate.
3Measurement precision
If laser-based optical measurement is used, then measurement precision is maintained, but wavelength stability deteriorates due to environmental factors
Solution Approach 1:
The patent uses the interference pattern itself as a reference feedback mechanism. By comparing the interference fringes generated by light scattering off cellular structures with the known wavelength characteristics, the system can compensate for wavelength variations and maintain measurement precision even when environmental factors cause drift.
Solution Approach 2:
The patent changes from relying on absolute wavelength stability to using relative wavelength measurements through interference patterns. The interference fringe spacing and patterns provide intrinsic reference information that allows the system to maintain precision by measuring changes relative to the interference pattern rather than requiring fixed wavelength stability.
4Ease of operation
If simple optical detection is used, then ease of operation improves, but measurement precision deteriorates due to insufficient signal intensity
Solution Approach 1:
The patent exploits the wave nature of light and interference effects to amplify the optical signal. By using interference between scattered light and reference light, the system converts weak scattering signals into measurable interference patterns with enhanced contrast and intensity, maintaining precision while using simple detection equipment.
Solution Approach 2:
The patent combines multiple optical phenomena (light scattering, interference, and potentially polarization effects) to enhance the measurement signal. By integrating these optical effects in a unified measurement approach, the system achieves high signal intensity and quality using simple detection components rather than requiring complex individual elements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The apparatus enables precise and efficient acquisition of optical data with high intensity by leveraging light scattering and interference effects, facilitating rapid and accurate detection of target particles.
Implementation Method 1
an optical measuring apparatus capable of precisely acquiring information on target particles included in a sample by using a light scattering effect or light interference effect
Implementation Method 2
a chamber portion providing a space in which the input light input from the light source portion is multi-reflected or multi-scattered through multiple passages
Implementation Method 3
a chamber portion providing a space in which the input light input from the light source portion is multi-reflected or multi-scattered through multiple passages
Implementation Method 4
a sensor portion detecting speckles of scattered light output from the chamber portion
Implementation Method 5
a first polarization unit that is arranged between the chamber portion and the light source portion and arranged on an optical path of the input light, and a second polarization unit that is arranged between the chamber portion and the sensor portion
Data Source
AI summary
The present disclosure relates to an optical measuring apparatus. An embodiment of the present disclosure provides an optical measuring apparatus including a chamber portion including a first chamber accommodating a sample, and a second chamber providing a space in which light interference with scattered light emitted from the first chamber occurs, a light source portion irradiating input light toward the chamber portion, a sensor portion detecting speckles of output light that is output from the chamber portion, and a controller configured to estimate information about target particles in the sample by using the speckles of the detected output light.