Optical Splitting Module for Memory Test Signal Integrity
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Solution Overview
Problem
Existing memory test systems face challenges in reducing test time and cost while maintaining signal quality, especially when testing multiple memory devices, as electrical signal splitting often results in signal distortion and reliability issues due to impedance mismatching and high-frequency transmission.
Innovation Solution
The implementation of an optical splitting module that converts electrical clock and test signals into optical signals, splits them, and then reconverts the split optical signals back into electrical signals for use in memory devices, thereby reducing the need for duplicate output pins and minimizing signal distortion.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If electrical signal splitting is used to test multiple memory devices simultaneously, then test time is reduced, but signal quality deteriorates due to impedance mismatching and high-frequency transmission issues
Solution Approach 1:
The patent replaces the electrical signal transmission system with an optical signal transmission system. Electrical signals are converted to optical signals for transmission through optical fibers, which eliminates the impedance mismatching and high-frequency transmission issues inherent in electrical systems. This substitution enables simultaneous testing of multiple memory devices while maintaining signal integrity.
Solution Approach 2:
The patent introduces optical signals as an intermediary medium between the test system and multiple memory devices. By converting electrical signals to optical signals for transmission and then back to electrical signals at the destination, the system achieves clean signal distribution to multiple devices without the degradation problems of direct electrical splitting.
2Reliability
If optical signal splitting is used to test multiple memory devices simultaneously, then signal quality is maintained, but device complexity increases due to additional conversion components
Solution Approach 1:
The patent designs the optical transmission system to serve multiple memory devices simultaneously through a single optical source. The optical signal splitting capability allows one optical transmitter to feed multiple optical receivers, making the system multi-functional and reducing the need for separate transmission paths for each device.
Solution Approach 2:
The patent uses optical signal copying capability where a single optical signal can be replicated and distributed to multiple destinations simultaneously. This allows the test system to provide identical clock and control signals to multiple memory devices through optical distribution, maintaining signal quality while simplifying the overall system architecture.
3Loss of time
If multiple memory devices are tested at the same time, then test cost is reduced, but signal distortion increases due to electrical splitting limitations
Solution Approach 1:
The patent replaces the electrical signal distribution system with an optical system to eliminate the signal distortion problems that occur during electrical signal splitting. Optical fibers transmit signals without the impedance-related distortions that plague electrical systems, enabling simultaneous testing of multiple devices with preserved signal integrity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach allows for simultaneous testing of multiple memory devices with maintained signal quality, reducing test time and cost, and ensuring reliable high-speed transmission without the drawbacks of electrical signal splitting.
Implementation Method 1
an electrical-optical signal converting unit which converts each of the clock signal and the test signal into an optical signal
Implementation Method 2
an optical signal splitting unit which splits each of the optical clock signal and the optical test signal into n signals
Implementation Method 3
an optical-electrical signal converting unit which receives the split optical clock signal and the split optical test signal to convert the split optical clock signal and the split optical test signal into electrical signals
Data Source
AI summary
A memory test system is disclosed. The memory system includes a memory device, a tester generating a clock signal and a test signal for testing the memory device, and an optical splitting module. The optical splitting module comprises an electrical-optical signal converting unit which converts each of the clock signal and the test signal into an optical signal to output the clock signal and the test signal as an optical clock signal and an optical test signal. The optical splitting unit further comprises an optical signal splitting unit which splits each of the optical clock signal and the optical test signal into n signals (n being at least two), and an optical-electrical signal converting unit which receives the split optical clock signal and the split optical test signal to convert the split optical clock signal and the split optical test signal into electrical signals used in the memory device.