Optoelectronic Device With Variable Interval Electrical Restraint Contact Areas
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Solution Overview
Problem
Current light-emitting diode (LED) packages face challenges with current crowding and heat dissipation limitations due to the use of thermosetting materials like epoxy, which restrict their application to low power consumption and limit brightness enhancement.
Innovation Solution
The optoelectronic device incorporates a semiconductor stack with a first and second conductivity type semiconductor layer, a first electrode, and a first extension electrode with variable interval electrical restraint contact areas, along with a groove exposing the first conductivity type semiconductor layer, alleviating current crowding by adjusting current injection intervals and using a second conductivity type contact layer with a narrower distance than the extension electrode width.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If epoxy encapsulation is used for LED packaging, then the LED can be protected and encapsulated, but the thermal resistance increases and heat dissipation is limited
Solution Approach 1:
The patent segments the contact area between the electrode and semiconductor layer into multiple electrical restraint contact areas with different intervals. This segmentation allows different regions to have different electrical restraint characteristics, enabling optimized current distribution while maintaining effective heat dissipation pathways through the encapsulation material.
Solution Approach 2:
The patent applies local quality by creating variable interval electrical restraint contact areas where the interval distance varies across different locations. Areas closer to the LED chip have smaller intervals for better current restraint, while areas farther away have larger intervals, creating a gradient structure that optimizes both electrical performance and thermal management locally.
2Ease of manufacture
If conventional LED package structure is used, then manufacturing is simple, but current crowding occurs and brightness is limited
Solution Approach 1:
The patent introduces dynamic characteristics by using variable interval electrical restraint contact areas instead of uniform spacing. This dynamic structure allows the electrical restraint effect to adapt to the current distribution pattern, with tighter spacing where current density is higher and wider spacing where current density is lower, thereby preventing current crowding and enhancing brightness.
Solution Approach 2:
The patent changes the geometric parameter of the contact area configuration by varying the interval distances between electrical restraint contact areas. This parameter change optimizes the electrical field distribution and current flow patterns, reducing current crowding effects while maintaining compatibility with conventional manufacturing processes.
3Ease of manufacture
If uniform contact area distribution is used, then manufacturing is easy, but current crowding is not effectively reduced
Solution Approach 1:
The patent applies asymmetry by using non-uniform, variable interval spacing for the electrical restraint contact areas instead of symmetric uniform spacing. This asymmetric distribution is strategically designed to match the current density distribution, providing stronger electrical restraint where needed and reducing manufacturing complexity compared to precise uniform spacing while effectively controlling current distribution.
Data Source
AI summary
The application provides an optoelectronic device structure, comprising a semiconductor stack, comprising a first conductivity type semiconductor layer, an active layer, and a second conductivity type semiconductor layer; a first electrode electrically connecting with the first conductivity type semiconductor layer, and further comprising a first extension electrode; a second electrode electrically connecting with the second conductivity type semiconductor layer; and a plurality of electrical restraint contact areas between the semiconductor stack and the first extension electrode, wherein the plurality of electrical restraint contact areas is distributed in a variable interval.


