Orthogonal Robot Test System for Compact SLT Footprint
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Solution Overview
Problem
System-level testing (SLT) systems require large footprints to achieve sufficient testing speed and throughput, leading to space and operational inefficiencies.
Innovation Solution
A modular test system with a test carrier, device shuttle, and robot that moves devices in multiple dimensions, allowing for concurrent testing of devices while maintaining a compact footprint, utilizing independent movement of shuttles and robots to optimize testing speed and space usage.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If traditional SLT systems are used to achieve sufficient testing speed and throughput, then testing productivity is improved, but system footprint area increases significantly
Solution Approach 1:
The patent transitions from traditional two-dimensional planar movement to three-dimensional orthogonal movement by introducing a vertical dimension (Z-axis) for test carrier transport. The test arm moves test carriers vertically between the test rack and carrier shuttle, while the carrier shuttle moves horizontally along the X-axis, and the robot moves devices laterally along the Y-axis. This dimensional expansion allows concurrent operations in different spatial planes, achieving high throughput within a compact footprint.
Solution Approach 2:
The system is divided into functionally independent modules: a robot for device handling, a test arm for carrier manipulation, and a carrier shuttle for transport. Each module operates independently in its own dimensional plane, allowing parallel execution of multiple testing operations simultaneously. This segmentation enables high productivity without requiring large system area.
2Productivity
If more devices are tested concurrently to improve productivity, then testing throughput increases, but system complexity increases
Solution Approach 1:
The test arm serves multiple functions: it retrieves test carriers from the test rack, transports them to the carrier shuttle, and can also place carriers back into the rack. The carrier shuttle simultaneously performs horizontal transport and vertical positioning. The robot handles both device loading onto carriers and unloading from carriers. This multi-functionality allows the system to test multiple devices concurrently using the same components, increasing throughput without proportionally increasing system complexity.
Data Source
AI summary
An example test system includes a test carrier to hold devices for test; a device shuttle to transport the devices; and a robot to move the devices between the test carrier and the device shuttle. The device shuttle is configured to move, towards a stage of the test system containing the robot, a first device among the devices that has not been tested. The device shuttle is configured to move in a first dimension. The robot is configured to move the first device from the device shuttle to the test carrier. The robot is configured to move in a second dimension that is different from the first dimension.