OTP Memory Write Circuit Voltage Feedback

Solution Overview

Problem

One-time programmable (OTP) memory technologies face challenges in efficiently programming and detecting the state of OTP cells, leading to potential overprogramming and varying programming times due to differences in cell characteristics.

Innovation Solution

A write circuit is implemented in the OTP memory that selectively programs OTP cells by detecting voltage levels on bit lines and adjusting bit line selection based on the programming state, allowing for sequential programming and preventing overprogramming by autonomously managing programming times based on cell characteristics.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a fixed programming time is applied to all OTP cells, then the programming process is simple to control, but overprogramming occurs and reliability decreases due to varying cell characteristics

Engineering Contradiction:
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent implements a feedback mechanism where the write circuit continuously monitors the voltage level of the bit line during programming. When the bit line voltage indicates that the OTP cell has reached the programmed state, the programming process is automatically terminated. This feedback-based approach prevents overprogramming and improves reliability without requiring complex external control, as the system self-regulates based on real-time cell state detection.

Inventive Principle:
Principle #23Feedback

2Manufacturing precision

If individual programming time is adjusted for each OTP cell based on cell characteristics, then programming precision is improved, but the programming process becomes more complex and time-consuming

Engineering Contradiction:
Core Design Contradiction:
Manufacturing precisionVSLoss of time

Solution Approach 1:

The patent enables the OTP cell to self-determine its programming completion status by monitoring its own bit line voltage characteristics. The write circuit detects when the cell has reached the programmed state through voltage level sensing, allowing each cell to effectively program itself without requiring external intervention or pre-calculated programming times. This self-service approach achieves precise programming while maintaining efficient timing, as the system naturally terminates programming at the optimal moment for each cell.

Inventive Principle:
Principle #25Self-service

3Reliability

If sequential bit line selection is implemented to prevent overprogramming, then programming reliability is improved, but the interface complexity with external devices increases

Engineering Contradiction:
Core Design Contradiction:
ReliabilityVSEase of operation

Solution Approach 1:

The write circuit autonomously manages the sequential selection of bit lines and monitoring of programming status without requiring complex external control signals. The system self-determines when to switch between bit lines based on detected voltage levels, effectively hiding the complexity of sequential programming management from the external interface. This approach maintains ease of operation while achieving improved reliability through automated bit line management and overprogramming prevention.

Inventive Principle:
Principle #25Self-service

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach reduces the total programming time for multiple OTP cells, prevents overprogramming, and simplifies the interface with external devices by dynamically adjusting programming based on cell characteristics, enhancing the reliability and efficiency of data writing.

Implementation Method 1

the write circuit is further configured to detect a voltage level of the selected bit line and select another bit line when the detected voltage level indicates that the selected OTP cell is in a programmed state

Methodology Applied
Scientific EffectVoltage level detection: Electric Field

Data Source

PatentUS10090059B2One time programmable memory and a data writing method thereof
Publication Date: 2018.10.02
  • US10090059B2 patent drawing
  • US10090059B2 patent drawing
  • US10090059B2 patent drawing

AI summary

A one time programmable (OTP) memory includes an OTP cell array including a plurality of OTP cells provided at locations where a plurality of word lines and a plurality of bit lines cross each other, and a write circuit configured to sequentially program the OTP cells by selecting the bit lines one at a time and program a selected OTP cell connected to the selected bit line, wherein the write circuit is further configured to detect a voltage level of the selected bit line and select another bit line when the detected voltage level indicates that the selected OTP cell is in a programmed state.