Output Latch Circuitry for Faster Memory Signal Transitions
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Solution Overview
Problem
Conventional set-reset (S-R) latches, particularly NAND S-R latches, introduce asymmetric rising and falling transition delays in output signals, which hinder memory access speed and computational performance due to sequential operation of cross-coupled NAND gates, leading to increased memory access times and impaired processor-memory interaction.
Innovation Solution
The implementation of an output latch with first and second output transition circuitries accelerates voltage level transitions at output nodes, bypassing the sequential operation of cross-coupled logic gates, thereby reducing memory access time by initiating output voltage transitions sooner than two logic gate operation delays.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional S-R latch with cross-coupled NAND gates is used, then data storage functionality is achieved, but asymmetric rising and falling transition delays occur in output signals
Solution Approach 1:
The patent applies preliminary action by pre-charging the output nodes before the actual data transition occurs. The output nodes are prepared with appropriate voltage levels in advance, so when the data transition happens, the output can switch states immediately without waiting for the full propagation delay through the cross-coupled NAND gates. This reduces the asymmetric rising and falling transition delays while maintaining reliable data storage functionality.
2Reliability
If sequential operation of cross-coupled NAND gates is used, then data storage is achieved, but memory access time increases
Solution Approach 1:
The patent segments the output buffer into multiple independent stages that can operate in parallel rather than sequentially. By dividing the output buffering function across multiple stages with separate control signals, the system eliminates the sequential propagation delay through cross-coupled gates. Each stage can transition independently, significantly reducing memory access time while maintaining data storage reliability.
3Device complexity
If conventional latch design is used, then circuit simplicity is maintained, but processor-memory interaction performance is impaired
Solution Approach 1:
The patent introduces intermediary control signals and additional buffering stages that mediate between the simple latch core and the external memory system. These intermediary elements include pre-charge control signals, enable signals, and multi-stage output buffers that accelerate data transfer. While these additions increase circuit complexity, they dramatically improve processor-memory interaction speed by eliminating the bottlenecks present in conventional latch designs.
Data Source
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AI summary
An integrated circuit (IC) is disclosed herein for accelerating memory access with an output latch. In an example aspect, the output latch includes a data storage unit, first circuitry, and second circuitry. The data storage unit includes a first input node configured to receive a first input voltage, a second input node configured to receive a second input voltage, a first output node configured to provide a first output voltage, and a second output node configured to provide a second output voltage. The first circuitry is configured to accelerate a voltage level transition of the first output voltage at the first output node responsive to the first input voltage at the first input node. The second circuitry is configured to accelerate a voltage level transition of the second output voltage at the second output node responsive to the second input voltage at the second input node.