Overlapping Sensor Arrays for Large-Area Sample Analysis

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Solution Overview

Problem

Conventional optical microscopes face challenges in analyzing large-area samples due to reduced field view at higher magnification, inactive pixel areas in sensors, and the need for multiple lenses and dyeing procedures, which hinder precise detection of fine differences in sample media.

Innovation Solution

A device comprising multiple sensor arrays and a control unit that captures image data by moving sensors and a light source, allowing for analysis without dyeing and using multiple wavelengths to detect sample components, while overlapping active sensor areas to cover the entire sample surface without gaps.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If multiple sensor arrays are arranged to cover large-area samples, then the field view is improved, but the device complexity increases

Engineering Contradiction:
Improvefield viewVSAvoiddevice complexity
Core Design Contradiction:
Area of stationary objectVSDevice complexity

Solution Approach 1:

The sensor system is divided into multiple sensor arrays (first sensor array and second sensor array) with overlapping active areas. Each sensor array captures a portion of the large-area sample, and the overlapping regions ensure complete coverage without gaps. This segmentation allows the system to maintain a large field view while managing complexity through modular sensor placement.

Inventive Principle:
Principle #1Segmentation

2Area of stationary object

If sensors are moved to capture large-area samples, then the field view is improved, but the measurement precision deteriorates

Engineering Contradiction:
Improvefield viewVSAvoidmeasurement precision
Core Design Contradiction:
Area of stationary objectVSMeasurement precision

Solution Approach 1:

The sensor arrays are pre-positioned with overlapping active areas before sample analysis begins. This preliminary arrangement ensures that all regions of the large-area sample, including fine details in overlapping zones, are captured with high precision from multiple perspectives. The overlapping configuration allows for potential image fusion or validation, maintaining measurement precision across the entire field view.

Inventive Principle:
Principle #10Preliminary action

3Measurement precision

If conventional optical microscope is used to detect fine differences in sample media, then the measurement precision is improved, but the device complexity increases due to multiple lenses and dyeing procedures

Engineering Contradiction:
Improvemeasurement precisionVSAvoiddevice complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The invention extracts and eliminates the dyeing step from the conventional optical microscope workflow. By using sensor arrays with overlapping active areas that can directly detect fine differences in sample media through their spatial resolution and signal processing capabilities, the system removes the need for additional dyeing procedures and multiple magnification lenses, thereby reducing device complexity while maintaining measurement precision.

Inventive Principle:
Principle #2Taking out (Extraction)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables precise analysis of large-area samples without the need for multiple lenses or dyeing, accurately detecting fine differences in sample media through overlapping sensor arrays and multi-wavelength imaging, improving the efficiency and accuracy of sample analysis.

Implementation Method 1

obtain image data for a cell included in the sample by using sensing data of the sensor on the sample

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Implementation Method 2

obtaining image data on a cell included in a sample by irradiating light having multiple wavelengths and by using sensing data sensed for each wavelength

Methodology Applied
Scientific EffectLight transmission and absorption: Absorption (EM radiation)

Data Source

PatentUS11624899B2Device for analyzing large-area sample based on image, device for analyzing sample based on image by using difference in medium characteristic, and method for measuring and analyzing sample using the same
Publication Date: 2023.04.11 SOL
  • US11624899B2 patent drawing
  • US11624899B2 patent drawing
  • US11624899B2 patent drawing

AI summary

Provided are a device for analyzing a large-area sample based on an image, a device for analyzing a sample based on an image by using a difference in medium characteristic, and a method for measuring and analyzing a sample by using the same. The device for analyzing a large-area sample includes a first sensor array including a plurality of sensors which are disposed while being spaced apart from each other in a first direction, a second sensor array including a plurality of sensors, which are disposed while being spaced apart from each other in the first direction, and spaced apart from the first sensor array in a second direction, and a control unit to obtain image data for a cell included in the sample by using sensing data of the sensor on the sample, in which the sample is interposed between the first sensor array and the second sensor array. An active area of one of the sensor in the first sensor array overlaps an active area of one of the sensors in the second sensor array, in the second direction.