Oxide Semiconductor Back Gate Threshold Voltage Control

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Solution Overview

Problem

Transistors using oxide semiconductors for semiconductor layers face issues with impurity entry, such as hydrogen or moisture, which generate carriers and alter the threshold voltage, affecting their electrical characteristics.

Innovation Solution

Incorporating a back gate structure with specific insulating films and conductive films to control the threshold voltage, where the first conductive film has a higher potential than the second conductive film, and using an oxide semiconductor layer with indium, gallium, and zinc, with a c-axis aligned crystal part, to manage potential application and reduce impurity effects.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If oxide semiconductors are used for semiconductor layers, then field-effect mobility is improved and manufacturing is simplified, but impurity entry (hydrogen or moisture) generates carriers and changes threshold voltage

Engineering Contradiction:
Improvefield-effect mobilityVSAvoidthreshold voltage stability
Core Design Contradiction:
SpeedVSReliability

Solution Approach 1:

The patent applies preliminary action by forming a protective inorganic insulating film (such as silicon oxide or silicon nitride) over the oxide semiconductor layer before impurity contamination can occur. This protective film is deposited in advance to prevent hydrogen or moisture from entering the oxide semiconductor, thereby maintaining threshold voltage stability while preserving the high field-effect mobility benefits of oxide semiconductors.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent introduces an intermediary protective inorganic insulating film between the oxide semiconductor layer and the external environment (sources of impurities like hydrogen and moisture). This intermediary layer acts as a barrier that prevents impurity entry while allowing the oxide semiconductor to maintain its electrical characteristics, thus resolving the contradiction between high mobility and threshold voltage stability.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Device complexity

If driver circuits are integrated with pixel transistors, then frame width and peripheral IC cost are reduced, but transistors require better electrical characteristics than pixel transistors alone

Engineering Contradiction:
Improveintegration of driver circuitsVSAvoidelectrical characteristics
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent applies local quality by providing selective protection to transistors in the driver circuit region through the inorganic insulating film, ensuring that these specific transistors (which require better electrical characteristics) are protected from impurity contamination. This allows integration of driver circuits with pixel transistors while maintaining the required electrical characteristics for driver circuit operation.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS9349750B2Semiconductor device and display device
Publication Date: 2016.05.24 SEMICON ENERGY LAB CO LTD
  • US9349750B2 patent drawing
  • US9349750B2 patent drawing
  • US9349750B2 patent drawing

AI summary

A semiconductor device includes: a transistor including a gate electrode, a gate insulating film over the gate electrode, a semiconductor layer over the gate insulating film, and a source electrode and a drain electrode over the semiconductor layer; a first insulating film comprising an inorganic material over the transistor; a second insulating film comprising an organic material over the first insulating film; a first conductive film over the second insulating film and in a region overlapping with the semiconductor layer; a third insulating film comprising an inorganic material over the first conductive film; and a second conductive film over the third insulating film and in a region overlapping with the first conductive film. The absolute value of a first potential applied to the first conductive film is greater than the absolute value of a second potential applied to the second conductive film.