Parallel Signal Routing Lines for Mismatched Die Contact Pitches

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Solution Overview

Problem

Conventional semiconductor device packaging processes face challenges in efficiently connecting semiconductor devices with different contact layouts, leading to increased cost and complexity due to the need for various intermediate structures, which are fabricated in advance and require complex design and inventory management.

Innovation Solution

A signal routing structure with a plurality of parallel conductive lines within a dielectric material layer, allowing for customizable electrical interconnections between semiconductor devices with different contact layouts, using straightforward processing techniques like masking, etching, and plating, and compatible with hybrid bonding.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If conventional packaging processes use intermediate structures to connect semiconductor devices with different contact layouts, then electrical connections can be achieved, but device complexity and manufacturing cost increase

Engineering Contradiction:
Improveability to connect devices with different contact layoutsVSAvoidcomplexity of intermediate structures
Core Design Contradiction:
Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The patent implements a universal bonding interface with a regular grid of bonding sites that can accommodate semiconductor devices with various contact layouts. The signal routing structure includes conductive lines arranged in a standardized pattern that can be configured through selective formation (e.g., using masks) to create different connection patterns, allowing a single interface design to serve multiple device types without requiring custom intermediate structures for each device layout.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The bonding interface is divided into discrete bonding sites arranged in a grid pattern, with signal routing structures that can be selectively formed between these sites. This segmentation allows the system to accommodate different contact layouts by selectively activating or deactivating specific routing paths, rather than requiring completely different intermediate structures for each device type.

Inventive Principle:
Principle #1Segmentation

2Ease of manufacture

If intermediate structures are fabricated in advance for packaging, then electrical connections can be established, but manufacturing cost and inventory management complexity increase

Engineering Contradiction:
Improveease of establishing electrical connectionsVSAvoidmanufacturing efficiency
Core Design Contradiction:
Ease of manufactureVSProductivity

Solution Approach 1:

The signal routing structure is designed to be dynamically configurable during the packaging process itself. Rather than requiring pre-fabricated intermediate structures with fixed connection patterns, the patent allows the routing patterns to be adapted on-demand through selective formation processes (such as selective plating or mask-based patterning) that can be performed as part of the standard packaging workflow, eliminating the need for separate pre-fabrication and inventory management steps.

Inventive Principle:
Principle #15Dynamics

Solution Approach 2:

The bonding interface structure is prepared in advance with a regular grid of bonding sites and basic dielectric layers, but the specific signal routing patterns are formed later during the packaging process based on the actual device requirements. This approach combines the benefits of pre-prepared infrastructure with on-demand customization, avoiding the need to fabricate complete intermediate structures in advance.

Inventive Principle:
Principle #10Preliminary action

3Reliability

If conventional packaging encapsulates dies to protect them, then environmental protection is achieved, but assembly height and processing complexity increase

Engineering Contradiction:
Improveprotection from environmental factorsVSAvoidassembly height
Core Design Contradiction:
ReliabilityVSLength of stationary object

Solution Approach 1:

The patent employs thin dielectric film layers to provide environmental protection for the bonding interface and semiconductor devices. Instead of thick encapsulant materials, the design uses multiple thin dielectric layers (such as spin-on-glass or other conformal dielectric films) that provide adequate protection while minimizing vertical space requirements, thus reducing overall assembly height.

Inventive Principle:
Principle #30Flexible shells and thin films

Solution Approach 2:

The bonding interface structure integrates the signal routing conductors within the dielectric layers rather than placing them externally. The conductive lines are embedded within or between dielectric layers, creating a nested configuration that provides protection while maintaining a compact vertical profile, eliminating the need for separate external encapsulation layers.

Inventive Principle:
Principle #7Nested doll (Nesting)

Data Source

PatentUS12538821B2Signal routing structures including a plurality of parallel conductive lines and semiconductor device assemblies including the same
Publication Date: 2026.01.27 MICRON TECHNOLOGY INC
  • US12538821B2 patent drawing
  • US12538821B2 patent drawing
  • US12538821B2 patent drawing

AI summary

A semiconductor device assembly includes a first semiconductor device having a first plurality of electrical contacts with a first average pitch, a second semiconductor device over the first semiconductor device and having a second plurality of electrical contacts with a second average pitch, and a signal routing structure between the first and second semiconductor devices and including a first plurality of conductive structures, each in contact with one of the first plurality of electrical contacts, a second plurality of conductive structures, each in contact with one of the second plurality of electrical contacts, and a pattern of parallel conductive lines between the first and second pluralities of conductive structures. The pattern of parallel conductive lines has a third average pitch less than the first and second average pitches, and pairs of conductive structures from the first and second pluralities are electrically coupled by different ones of the parallel conductive lines.