Parallel Test System for Semiconductor Die Testing
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Solution Overview
Problem
The increasing complexity of semiconductor dies due to higher circuit density leads to a significant increase in the time required for testing, as traditional sequential testing methods become inefficient with the growing number of tests needed to ensure correct functionality.
Innovation Solution
A system and method for performing concurrent testing by defining channel-independent test groups, where total-independence test groups are executed simultaneously and BUT-conflict test groups are performed in an overlapping manner, allowing multiple tests to be conducted without conflicting with each other.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If sequential testing methods are used to ensure correct functionality, then testing completeness is improved, but testing time increases significantly
Solution Approach 1:
The patent segments the testing process into multiple independent test groups that can be executed concurrently. Tests are divided into channel-independent groups where each group contains tests that do not conflict with each other for resource usage, allowing parallel execution while maintaining testing completeness
Solution Approach 2:
The patent transitions from sequential (one-dimensional) testing to parallel/concurrent (multi-dimensional) testing by executing multiple test groups simultaneously across different channels and blocks, fundamentally changing the testing paradigm from time-sequential to space-parallel execution
2Reliability
If the number of tests is increased to cover higher circuit density, then testing coverage is improved, but testing complexity increases
Solution Approach 1:
The patent segments the large number of tests into organized groups based on channel independence and block-under-test relationships. This segmentation reduces testing complexity by providing a structured approach to managing and executing numerous tests through hierarchical grouping and concurrent execution strategies
Solution Approach 2:
The patent changes the execution parameter from sequential to concurrent/parallel, fundamentally altering how tests are performed. By modifying the execution mode parameter, the system can handle increased testing coverage requirements without proportionally increasing testing complexity or time
Data Source
AI summary
A method and a system for defining groups of tests that may be concurrently performed or overlapped are provided. Channel-independent test groups are determined such that each group includes tests that the input/output channels may be utilized simultaneously without conflicts. The channel-independent test groups are divided into block-under-test (BUT) conflict test groups and total-independence test groups. The total-independence test groups may be performed concurrently. Performance of the BUT-conflict test groups may be overlapped such that the input/output channels are used concurrently, but the execution of the tests by the blocks of the device-under-test (DUT) is performed sequentially.