Particle Characterization Using Contaminant Scattering Correction
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Solution Overview
Problem
Existing particle characterization methods, such as photon correlation spectroscopy and static light scattering, are susceptible to contamination by larger particles, which skew the characterization of smaller particles due to their dominant scattering signal, leading to inaccurate results.
Innovation Solution
A method and apparatus for characterizing particles by light scattering that involves obtaining scattering measurements, determining a segregation parameter, identifying contaminated measurements, and correcting or excluding scattering contributions from large particles using high-pass and low-pass filtering, autocorrelation functions, and statistical analysis to derive accurate particle characteristics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If light scattering measurements are performed on samples containing both small particles and larger particles, then particle characterization can be obtained, but the larger particles dominate the scattering signal and skew the characterization of smaller particles
Solution Approach 1:
The patent segments the scattering signal analysis by dividing the data processing into distinct size ranges. It separates the characterization of small particles from large particles by applying different analysis methods to different size domains, allowing accurate measurement of both without one dominating the other.
Solution Approach 2:
The patent applies local quality by using size-dependent analysis parameters and thresholds. Different regions of the size distribution are analyzed with tailored parameters, where the analysis for small particles uses settings optimized for detecting weak scattering signals, while large particles are handled with parameters suited for their stronger signals.
2Measurement precision
If conventional light scattering analysis methods are used, then particle size distribution can be determined, but the presence of aggregates or filter spoil particles significantly degrades measurement quality
Solution Approach 1:
The patent performs preliminary action by implementing pre-processing steps that identify and flag potential contaminant particles before they can significantly affect the overall measurement. The system prepares by establishing contamination criteria and thresholds in advance, allowing it to selectively weight or exclude problematic data points during analysis.
Solution Approach 2:
The patent employs feedback mechanisms where the analysis results continuously inform the measurement process. The system monitors the scattered light signal in real-time, compares it against expected patterns, and adjusts the analysis parameters or excludes specific measurements when contaminants are detected, creating a closed-loop system that maintains measurement reliability.
3Measurement precision
If scattering measurements from all particles are included in the analysis, then comprehensive particle characterization is achieved, but contaminated measurements significantly skew the results
Solution Approach 1:
The patent applies partial action by selectively including only those scattering measurements that meet quality criteria in the final analysis. Rather than using all collected data, the system performs partial analysis on a subset of validated measurements, excluding those contaminated by large particles or aggregates, thus maintaining accuracy without sacrificing comprehensive coverage of valid data.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The method effectively distinguishes and corrects for scattering from contaminants, providing more accurate particle size distribution and other characteristics, especially in polydisperse samples, reducing the need for multiple photon counting detectors.
Implementation Method 1
obtaining a plurality of scattering measurements, each scattering measurement comprising a time series of measurements of scattered light from a detector, the scattered light produced by the interaction of an illuminating light beam with the sample
Data Source
AI summary
A method of characterising particles in a sample, comprising: obtaining a scattering measurement comprising a time series of measurements of scattered light from a detector, the scattered light produced by the interaction of an illuminating light beam with the sample; producing a corrected scattering measurement, comprising compensating for scattering contributions from contaminants by reducing a scattering intensity in at least some time periods of the scattering measurement; determining a particle characteristic from the corrected scattering measurement.