Automated PCell Layout Verification in EDA Software

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Solution Overview

Problem

The current manual approaches for generating parameterized cell (PCell) variants in analog integrated circuit design are time-consuming and inefficient, requiring extensive manual schematic and layout view generations, which limits design process speed and reusability.

Innovation Solution

An automated method using electronic design automation software to generate multiple schematic and layout variants based on a set of PCell parameters, enabling automatic execution of verification steps such as Schematic vs. Schematic, Layout vs. Schematic, and Layout vs. Layout, reducing the need for manual creation and minimizing errors.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If manual approaches are used for generating PCell variants, then design accuracy can be maintained through human review, but design process speed and productivity are significantly reduced

Engineering Contradiction:
Improvedesign process speedVSAvoidmanual schematic and layout view generation time
Core Design Contradiction:
ProductivityVSLoss of time

Solution Approach 1:

The system enables self-service automation where the EDA software automatically generates multiple schematic and layout variants based on PCell parameters, performs verification steps, and produces design outputs without requiring manual human intervention for each variant generation

Inventive Principle:
Principle #25Self-service

Solution Approach 2:

The patent replaces the mechanical manual process of schematic and layout generation with an automated software-based system that uses procedural generation and algorithmic verification to produce design variants, eliminating the need for manual drafting and review cycles

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Ease of operation

If manual schematic and layout view generations are performed, then design flexibility and adaptability are maintained, but ease of operation and efficiency are reduced

Engineering Contradiction:
Improvemanual creation effortVSAvoiddesign reusability
Core Design Contradiction:
Ease of operationVSAdaptability or versatility

Solution Approach 1:

The system creates universally applicable PCell variants that can be reused across different design contexts by automatically generating multiple schematic and layout views from a single parameterized cell definition, making the designs adaptable to various applications without requiring separate manual creation for each case

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Productivity

If automated generation is implemented, then productivity and speed are improved, but manufacturing precision and verification accuracy may be compromised

Engineering Contradiction:
Improvevariant generation speedVSAvoidschematic and layout verification accuracy
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The system incorporates automated verification steps that provide feedback on the generated schematic and layout variants, checking for design rule compliance, connectivity errors, and manufacturing feasibility, thereby ensuring precision is maintained despite automated generation

Inventive Principle:
Principle #23Feedback

Solution Approach 2:

The patent performs preliminary automated verification and validation of PCell variants before final design implementation, conducting schematic vs. schematic, layout vs. schematic, and layout vs. layout comparisons in advance to catch errors early in the design process

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS20240411978A1Automatic procedural cell level layout verification of custom parameterized cell library cells in an electronic design automation software program
Publication Date: 2024.12.12 INTEL CORP
  • US20240411978A1 patent drawing
  • US20240411978A1 patent drawing
  • US20240411978A1 patent drawing

AI summary

A method to manufacture an integrated semiconductor device is provided, the method including: select a plurality of integrated circuit semiconductor device component layouts of an entity of integrated circuit semiconductor device component layouts based on a shared set of parameters; perform at least one compatibility verification process for the selected plurality of integrated circuit semiconductor device component layouts with regard to an environment of the integrated circuit semiconductor device component at a predetermined position in an integrated circuit semiconductor device; and output a compatibility verification information indicating a result of the at least one compatibility verification process for the plurality of integrated circuit semiconductor device component layouts.