Low Power Phase Change Memory Cell Partial Crystallization

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Solution Overview

Problem

Traditional phase change memory cells require high programming currents due to their low resistance in the fully crystalized state, leading to high power consumption and potential leakage issues, limiting the development of low power devices and large memory cells.

Innovation Solution

The use of phase change materials with a partially crystallized set state and high resistance, which allows for lower current pulses (less than 200 μA) to switch between states, reducing power consumption and increasing the blocking margin, utilizing materials like indium-germanium-tellurium (IGT) or indium-antimony-tellurium (IST) alloys.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If traditional phase change memory cells are used with fully crystalized state, then the memory cell can be programmed, but the resistance is low leading to high power consumption and leakage issues

Engineering Contradiction:
Improvememory programming capabilityVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The patent changes the electrical resistance parameter of the phase change material by controlling the crystallization process to achieve a partially crystallized state with high resistance. This allows the material to maintain its memory programming capability while significantly reducing power consumption and leakage current by operating in a high-resistance state rather than a low-resistance state.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent utilizes phase transition of the phase change material between amorphous and partially crystallized states. By controlling the material to transition to a partially crystallized state rather than fully crystallized state, the invention achieves high resistance for low power consumption while maintaining non-volatile memory functionality.

Inventive Principle:
Principle #36Phase transitions

2Reliability

If traditional phase change memory cells are used, then memory functionality is achieved, but leakage current is high and blocking margin is reduced

Engineering Contradiction:
Improvememory functionalityVSAvoidleakage current
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The patent modifies the resistance parameter of the phase change material through controlled partial crystallization. This parameter change increases the resistance to >1 MΩ in the set state, which directly reduces leakage current and improves blocking margin while preserving the memory's ability to store data through phase transitions.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If high programming currents are used, then phase change memory can be programmed, but power consumption increases and device scaling is limited

Engineering Contradiction:
Improveprogramming capabilityVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSPower

Solution Approach 1:

The patent changes the resistance parameter of the phase change material to a high-resistance state through partial crystallization. This allows programming to be achieved with lower currents (<200 μA) because the high resistance state provides better current confinement and reduces the overall power requirement for switching operations.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables the fabrication of low power devices and larger memory cells with reduced leakage current and increased blocking margin, using less than 200 μA of current to switch states, and exhibits a highly nonlinear current-voltage response, effectively addressing the power consumption and leakage issues of traditional phase change memory cells.

Implementation Method 1

Phase change memory devices utilize materials that have different electrical properties in their crystalline and amorphous phases

Methodology Applied
Scientific EffectPhase change: Phase Change

Implementation Method 2

Phase change memories are often programmed using heat generated by an electrical current to control the state of the phase change material

Methodology Applied
Scientific EffectJoule heating: Joule Heating

Data Source

PatentUS8971089B2Low power phase change memory cell
Publication Date: 2015.03.03 SK HYNIX NAND PRODUCT SOLUTIONS CORP
  • US8971089B2 patent drawing
  • US8971089B2 patent drawing
  • US8971089B2 patent drawing

AI summary

A memory may include two electrodes and phase change material having an amorphous reset state and a partially crystalized set state, coupled between the two electrodes. The phase change material in the set state may have a highly nonlinear current-voltage response in a subthreshold voltage region. The phase change material may be an alloy of indium, antimony, and tellurium.