Photodetector Work Function Engineering for Dark Current Reduction

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Solution Overview

Problem

Conventional optoelectronic devices, such as image sensors and photovoltaic devices, face limitations in sensitivity, dynamic range, and dark current, which affect their performance in converting optical signals to electronic signals efficiently.

Innovation Solution

The development of photodetectors with a p-type semiconductor optically sensitive material, featuring a bias voltage applied between contacts with specific work functions, and an electron lifetime greater than the electron transit time, along with a surface recombination velocity less than 1 cm/s, to enhance sensitivity and minimize dark current.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If conventional optically sensitive materials are used in image sensors and photovoltaic devices, then the devices can perform basic photon to electron conversion, but the sensitivity, dynamic range, and dark current performance are limited

Engineering Contradiction:
ImprovesensitivityVSAvoiddark current
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent changes the work function parameter of the contact materials to be greater than 4.5 eV (such as using aluminum, tungsten, or titanium nitride), and optimizes the band alignment between these contacts and the optically sensitive material. This parameter change creates favorable energy band offsets that reduce dark current while maintaining high sensitivity for photon detection.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The patent employs composite material structures combining high work function contact materials (with work function > 4.5 eV) with specific optically sensitive materials. This composite approach leverages the complementary properties of each material to achieve both low dark current and high sensitivity, resolving the contradiction between these two performance parameters.

Inventive Principle:
Principle #40Composite materials

2Measurement precision

If the electron lifetime is increased to improve sensitivity, then the detection capability is enhanced, but the device complexity and fabrication difficulty increase

Engineering Contradiction:
ImprovesensitivityVSAvoidfabrication complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent achieves long electron lifetime (greater than electron transit time) by changing the material composition and interface properties rather than increasing device dimensions or adding complex structures. The high work function contacts and optimized band alignment naturally extend electron lifetime, improving sensitivity without increasing fabrication complexity.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If the surface recombination velocity is reduced to minimize dark current, then the signal-to-noise ratio improves, but the manufacturing precision requirements increase

Engineering Contradiction:
Improvedark currentVSAvoidinterface quality
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The patent reduces surface recombination velocity by changing the work function parameter of the contact materials to greater than 4.5 eV and optimizing the band alignment at the contact-interface. This material parameter change inherently reduces surface recombination without requiring extreme manufacturing precision, as the effect is achieved through material selection rather than ultra-precise interface control.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

These photodetectors provide high sensitivity, fast response times, and a wide dynamic range, enabling efficient light detection across various spectral bands with minimized noise and dark current, suitable for applications like video imaging and solar cells.

Implementation Method 1

optically sensitive material between the first contact and the second contact... providing injection of electrons

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS8138567B2Materials, fabrication equipment, and methods for stable, sensitive photodetectors and image sensors made therefrom
Publication Date: 2012.03.20 INVISAGE TECHNOLOGIES INC
  • US8138567B2 patent drawing
  • US8138567B2 patent drawing
  • US8138567B2 patent drawing

AI summary

Optically sensitive devices include a device comprising a first contact and a second contact, each having a work function, and an optically sensitive material between the first contact and the second contact. The optically sensitive material comprises an n-type semiconductor, and the optically sensitive material has a work function. Circuitry applies a bias voltage between the first contact and the second contact. The optically sensitive material has an electron lifetime that is greater than the electron transit time from the first contact to the second contact when the bias is applied between the first contact and the second contact. The first contact provides injection of electrons and blocking the extraction of holes. The interface between the first contact and the optically sensitive material provides a surface recombination velocity less than 1 cm/s.