Photosensitive Switching Apparatus for Non-Destructive PCB Testing
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Solution Overview
Problem
Existing methods for testing printed circuit boards are prone to damaging the conductor tracks due to the required contact pressure, and they often require complex setups with lasers and external power sources, which can lead to inaccuracies and short circuits.
Innovation Solution
A switching apparatus with a photosensitive functional layer that becomes conductive under specific electromagnetic radiation, allowing for precise and gentle electrical contact without external lamps or complex deflector systems, and a transistor arrangement for controlled current flow, enabling testing of assembled boards without risking damage to components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If contact pressure is applied to establish electrical connection with testing needles, then reliable electrical contact is achieved, but the conductor track may be damaged or destroyed
Solution Approach 1:
The patent replaces the mechanical contact system (testing needles pressing on conductor tracks) with an optical system. A laser beam is used to locally illuminate the photosensitive layer, which then becomes conductive only in the illuminated area, allowing electrical testing without mechanical contact pressure that could damage the thin conductor tracks.
Solution Approach 2:
The patent changes the electrical conductivity parameter of the photosensitive layer by controlling illumination. The layer transitions from insulating state (dark) to conductive state (illuminated), enabling selective electrical contact only where needed, thus avoiding damage to conductor tracks while ensuring reliable testing.
2Measurement precision
If a separate test adapter is made for every printed circuit board, then precise testing is achieved, but device complexity and manufacturing cost increase
Solution Approach 1:
The patent makes the testing system universal by using a single test adapter with a photosensitive layer that can be programmed through laser illumination patterns. Instead of requiring different physical adapters for different PCB designs, the same adapter can be reconfigured by controlling which areas of the photosensitive layer are illuminated, allowing precise testing across various board layouts without increasing physical complexity.
Solution Approach 2:
The patent introduces dynamic reconfigurability to the test adapter. The photosensitive layer's conductivity pattern can be dynamically changed by modifying the laser illumination pattern, allowing the same physical adapter to adapt to different testing requirements and PCB designs without physical reconfiguration or replacement.
3Measurement precision
If laser illumination is used to make photosensitive layer conductive, then precise electrical contact is achieved, but the system requires complex deflector systems and external power sources
Solution Approach 1:
The patent extracts the illumination source from the external environment and integrates it directly into the test adapter structure. By incorporating the light source within the adapter itself, the system eliminates the need for complex external laser systems, deflector mirrors, and separate power sources, while maintaining precise illumination control for making the photosensitive layer conductive.
4Ease of manufacture
If the photosensitive layer lies directly on the conductor tracks, then testing is simplified, but inaccuracies in illumination may cause short circuits with adjacent tracks
Solution Approach 1:
The patent segments the illumination function into multiple independent light sources arranged in a matrix pattern. Each light source can be individually controlled to illuminate only its corresponding region, preventing stray light from causing unintended conductivity in adjacent areas. This segmentation maintains testing simplicity while eliminating the short circuit risk associated with inaccurate illumination.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution allows for reliable and non-destructive testing of printed circuit boards, reducing the risk of short circuits and damage, while enabling precise control over the testing process, even for sensitive components, with a compact and cost-effective design.
Implementation Method 1
the functional layer is made from at least one of the group comprising a layer of a photosensitive material... the emitted electromagnetic radiation acts predominantly in the direction of the functional layer
Data Source
AI summary
The invention relates to a switching apparatus (1) for conducting electrical contact tests on bare and assembled printed circuit boards (12), comprising at least a flat support layer (2), a first electrode arrangement (3) and a functional layer (4), which support layer (2) is elastically restorably deformable, and the functional layer (4) is disposed on top of the first electrode arrangement (3). The functional layer (4) is made from at least one of the group comprising a layer of a photosensitive material (7), a quantum detector and a photoresistor, and at least one source for electromagnetic radiation (8) is additionally disposed above the functional layer (7), and the emitted electromagnetic radiation predominantly acts in the direction of the functional layer (4). The functional layer (4) may also be provided in the form of a transistor arrangement (9) made up of a plurality of transistors. The invention further relates to a method of producing a switching apparatus (1).