Pillar-Shaped Bit Line Contact Structures for Semiconductor Memory Devices

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

As semiconductor devices become more integrated, design rules for their elements are reduced, necessitating improvements in bit line contact margin to prevent mutual interference and reduce parasitic capacitance.

Innovation Solution

The semiconductor device incorporates a pillar-shaped bit line contact region with an upper surface higher than the field region, a damascene structure for the bit line, and a storage node contact plug, along with a contact spacer and bit line spacer to enhance contact margins and reduce capacitance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If design rules are reduced to increase integration degree, then device integration increases, but bit line contact margin decreases and mutual interference increases

Engineering Contradiction:
Improvedevice integrationVSAvoidbit line contact margin
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent transitions from a planar bit line contact structure to a three-dimensional pillar-shaped contact structure. The bit line contact region extends vertically from the substrate surface upward, creating multiple spatial dimensions for contact. This vertical extension increases the contact area and margin without occupying additional lateral space, thereby maintaining high integration while improving contact reliability and reducing mutual interference between adjacent bit lines.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Ease of manufacture

If conventional planar bit line contact structure is used, then manufacturing is simpler, but parasitic capacitance increases and contact margin is insufficient

Engineering Contradiction:
Improvecontact structure fabricationVSAvoidparasitic capacitance
Core Design Contradiction:
Ease of manufactureVSObject-generated harmful factors

Solution Approach 1:

The bit line contact structure is segmented into distinct functional regions: the pillar-shaped contact region extending from the substrate, the interlayer insulating layer, and the bit line formed in the trench. This segmentation allows each component to be optimized independently - the pillar contact provides mechanical and electrical stability, the insulating layer provides electrical isolation to reduce parasitic capacitance, and the bit line provides conductive connection. The combined effect reduces parasitic capacitance while maintaining manufacturability through standard semiconductor fabrication processes.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS9716095B2Semiconductor memory devices with multi-level contact structures
Publication Date: 2017.07.25 SAMSUNG ELECTRONICS CO LTD
  • US9716095B2 patent drawing
  • US9716095B2 patent drawing
  • US9716095B2 patent drawing

AI summary

A semiconductor device includes a substrate having a field region disposed therein that defines an active region of the substrate, the active region comprising a pillar-shaped bit line contact region having an upper surface disposed at a higher level than an upper surface of the field region. An interlayer insulating layer is disposed on the substrate and covers the field region. A bit line is disposed in a trench in the interlayer insulating layer above the pillar-shaped bit line contact region and electrically connected thereto.