Pipe Latch Circuit Timing Control for Memory Data Latching
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Solution Overview
Problem
The increasing number of pipe latching units in semiconductor memory devices due to rising CAS latency and operation frequency leads to increased circuit size, making circuit design burdensome and prone to abnormal operations, especially when the number of data pads increases.
Innovation Solution
A semiconductor memory device with a time measurement unit that measures the latching operation time and generates a delay control signal to adjust the activation time of the column selection signal, reducing the number of pipe latching units and minimizing data latching time, thereby optimizing circuit operation and reducing chip size.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the number of pipe latching units is increased to handle higher CAS latency and operation frequency, then the data latching capability is improved, but the circuit size increases
Solution Approach 1:
The patent combines multiple pipe latching units into a single integrated circuit block, merging their functions into one unified structure that handles data latching for multiple data pads simultaneously, thereby reducing overall circuit size while maintaining productivity
Solution Approach 2:
The integrated pipe latching circuit is designed to serve multiple data pads with different CAS latency requirements through a universal structure that can be configured for various operating conditions, eliminating the need for separate dedicated latching units for each data pad
2Reliability
If the number of pipe latching units is increased to ensure reliable data latching, then the reliability is improved, but the device complexity increases
Solution Approach 1:
The integrated pipe latching circuit is segmented into multiple functional blocks that can be independently configured and controlled, allowing each segment to handle specific data pads with particular reliability requirements while maintaining overall system reliability without excessive complexity
Solution Approach 2:
The circuit incorporates dynamic control mechanisms that adjust the operation of pipe latching units based on real-time conditions such as CAS latency values and data pad configurations, enabling the circuit to maintain optimal reliability across varying operating conditions without requiring a fixed complex structure
Data Source
AI summary
A semiconductor memory device includes a memory bank configured to output stored data in response to a column selection signal, a plurality of data latching units configured to latch the data outputted from the memory bank in response to an input control signal which is generated according to the column selection signal, and output the latched data in response to an output control signal, a time measurement unit configured to measure a time from an activation of the input control signal to an activation of the output control signal and generate a delay control signal, and an activation control unit configured to control an activation time of the column selection signal in response to the delay control signal.