Planarized Buffer Contact for Phase Change Memory

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Solution Overview

Problem

Phase change memory devices with recessed data storage patterns face challenges in achieving stable contact with contact structures due to the recessed region on their upper surface, which affects integration density and performance.

Innovation Solution

A contact structure is developed with a planarized buffer pattern filled into the recessed region of the data storage pattern, including a conductive material, and a conductive pattern formed on top, which is self-aligned with the data storage pattern, along with an insulating layer and conductive plug for stable electrical connection.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a contact structure is formed directly on a data storage pattern with a recessed region, then the structure is simpler, but stable contact cannot be realized

Engineering Contradiction:
Improvecontact stabilityVSAvoidcontact structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

A planarized buffer pattern is introduced as an intermediary layer between the data storage pattern and the conductive pattern. This buffer pattern fills the recessed region and provides a planarized upper surface, enabling stable contact formation without requiring complex direct contact structures.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The contact structure is divided into multiple segments: the data storage pattern, the planarized buffer pattern, and the conductive pattern. This segmentation allows each layer to perform its specific function - the buffer layer provides mechanical support and planarization while the conductive layer provides electrical connection.

Inventive Principle:
Principle #1Segmentation

2Reliability

If the conductive pattern is formed to conform to the recessed region, then contact area is increased, but manufacturing precision is reduced

Engineering Contradiction:
Improvecontact stabilityVSAvoidconductive pattern alignment
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The planarized buffer pattern is formed in advance to fill and planarize the recessed region before the conductive pattern is deposited. This preliminary action creates a flat surface that simplifies subsequent patterning and alignment processes, ensuring high manufacturing precision.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The planarized buffer pattern serves as a mediator that decouples the recessed region geometry from the conductive pattern formation. The buffer layer absorbs the geometric complexity, allowing the conductive pattern to be formed with high precision on a planar surface.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Reliability

If a planarized buffer pattern is added to fill the recessed region, then contact stability is improved, but device complexity increases

Engineering Contradiction:
Improvecontact stabilityVSAvoidlayer structure complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The planarized buffer pattern performs multiple functions simultaneously: it fills the recessed region to provide mechanical support, planarizes the upper surface for precise patterning, and serves as an adhesive interface between the data storage pattern and conductive pattern. This multi-functionality reduces the need for additional specialized layers.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The planarized buffer pattern is selectively applied only where needed - filling the recessed region of the data storage pattern - rather than being applied uniformly across the entire device. This localized application minimizes the increase in device complexity while achieving the desired contact stability.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS8039829B2Contact structure, a semiconductor device employing the same, and methods of manufacturing the same
Publication Date: 2011.10.18 SAMSUNG ELECTRONICS CO LTD
  • US8039829B2 patent drawing
  • US8039829B2 patent drawing
  • US8039829B2 patent drawing

AI summary

A contact structure that includes a first pattern formed on a substrate, wherein the first pattern has a recessed region in an upper surface thereof, a planarized buffer pattern formed on the first pattern, and a conductive pattern formed on the planarized buffer pattern.