PMIC Overvoltage Clamp Circuit for Memory Module Protection

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Solution Overview

Problem

Memory modules face challenges in managing unstable power conditions, particularly due to the hot plug-short phenomenon, which can lead to overcurrent, fire, or damage to memory modules and connected systems.

Innovation Solution

A power management integrated circuit (PMIC) is designed to protect memory modules from hot plug-short phenomena by incorporating an internal output transistor, a self-overvoltage protection circuit, and a clamp circuit that can operate in normal, overvoltage sensing, and overvoltage clamp modes to stabilize the output voltage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If memory modules are connected or disconnected during operation (hot plug), then system adaptability is improved, but the risk of hot plug-short phenomenon and overcurrent increases

Engineering Contradiction:
Improvehot plug capabilityVSAvoidhot plug-short phenomenon
Core Design Contradiction:
Adaptability or versatilityVSObject-affected harmful factors

Solution Approach 1:

The patent implements preliminary protective actions by designing the PMIC to detect overvoltage conditions before they can cause damage. The circuit proactively monitors voltage levels and prepares protection mechanisms in advance, switching to safe operating modes before the hot plug-short phenomenon can occur, thus preventing harm while maintaining hot plug adaptability

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent converts the potentially harmful overvoltage condition into a beneficial protective mechanism. When overvoltage is detected during hot plug operations, the PMIC actively switches to overvoltage clamp mode or second overvoltage clamp mode, using the detected abnormal condition to trigger protection that prevents the hot plug-short phenomenon, thereby turning a harmful event into a safety feature

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Reliability

If the PMIC includes protection circuits for hot plug-short prevention, then reliability is improved, but device complexity increases

Engineering Contradiction:
Improveprotection from hot plug-shortVSAvoidPMIC circuit structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent achieves multi-functionality by designing the PMIC to handle multiple operating modes within a unified circuit architecture. The same PMIC circuit structure supports normal mode, first overvoltage clamp mode, and second overvoltage clamp mode operations, allowing it to provide both protection functions and power management in a single integrated design, thus improving reliability without proportionally increasing complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent uses parameter changes to manage complexity by switching between different operational states based on voltage conditions. The PMIC adjusts its operating parameters dynamically - switching between normal mode, first overvoltage clamp mode (with first clamp voltage), and second overvoltage clamp mode (with second clamp voltage lower than first) - allowing a single circuit to provide comprehensive protection through parameter adjustment rather than requiring separate dedicated circuits for each protection level

Inventive Principle:
Principle #35Parameter changes

3Reliability

If the PMIC stabilizes output voltage during overvoltage conditions, then durability is improved, but power loss increases

Engineering Contradiction:
Improvedurability under unstable powerVSAvoidpower dissipation in clamp mode
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The patent implements dynamic operation by allowing the PMIC to adaptively switch between different clamp modes based on the severity of overvoltage conditions. The circuit dynamically adjusts its protection level - using first overvoltage clamp mode for moderate overvoltage and second overvoltage clamp mode for severe overvoltage - optimizing the balance between durability protection and power loss by matching the protection intensity to the actual threat level

Inventive Principle:
Principle #15Dynamics

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The PMIC effectively enhances the durability and reliability of memory modules by stabilizing the output voltage and preventing damage from unstable power conditions, thereby minimizing the risk of overcurrent and fire hazards.

Implementation Method 1

a clamp circuit outputting, as the internal output voltage, a first clamp voltage with a uniform level in a first overvoltage clamp mode and a second clamp voltage, which is leveled down from the external voltage, in a second overvoltage clamp mode

Methodology Applied
Scientific EffectVoltage clamping:

Implementation Method 2

a self-overvoltage protection circuit detecting whether the external voltage exceeds a breakdown condition for the internal output transistor

Methodology Applied
Scientific EffectOvervoltage detection:

Data Source

PatentUS20250166692A1Power management integrated circuit and memory module includng the same
Publication Date: 2025.05.22 SAMSUNG ELECTRONICS CO LTD
  • US20250166692A1 patent drawing
  • US20250166692A1 patent drawing
  • US20250166692A1 patent drawing

AI summary

A power management integrated circuit includes an internal output transistor connected to an external voltage input line, to which an external voltage is supplied, and outputting an internal output voltage, a self-overvoltage protection circuit detecting whether the external voltage exceeds a breakdown condition for the internal output transistor and providing a gate voltage to a gate terminal of the internal output transistor and a clamp circuit outputting, as the internal output voltage, a first clamp voltage having a uniform level in a first overvoltage clamp mode and a second clamp voltage, which is leveled down from the external voltage, in a second overvoltage clamp mode. When the internal output transistor is turned off, the clamp circuit outputs the internal output voltage. The external voltage in the second overvoltage clamp mode may be greater than the external voltage in the first overvoltage clamp mode.