Parametric Measurement Unit State Transition Control
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Solution Overview
Problem
Existing automatic test equipment (ATE) systems face challenges in transitioning parametric measurement units (PMUs) between operational states, leading to signal glitches such as voltage or current spikes, which can cause functional instability in devices under test and result in invalid test results or damage.
Innovation Solution
The implementation of a test control circuit with a subsystem and transition control circuit that transitions PMUs through a minimum unit transition path, involving changes to nearest DUT non-driving modes and subsequent mode changes, while configuring settings in a controlled order to avoid glitches, using a state register block and mode multiplexer to manage operational states and configuration settings.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If direct mode transition is performed between DUT driving modes, then transition speed is improved, but signal glitches occur causing functional instability
Solution Approach 1:
The patent applies preliminary action by transitioning to a DUT non-driving mode before changing configuration settings. This preparatory step ensures that the PMU output is disconnected from the DUT prior to parameter changes, preventing signal glitches from affecting DUT operation. The transition path is designed to first exit driving mode, perform configuration changes, then re-enter driving mode, ensuring stability throughout the transition process.
2Adaptability or versatility
If configuration settings are changed during mode transition, then adaptability is improved, but signal glitches and voltage spikes occur
Solution Approach 1:
The patent uses a DUT non-driving mode as an intermediary state between different DUT driving modes. This intermediate state acts as a buffer that isolates the DUT from configuration changes. The transition path goes through this intermediary mode where the PMU output is in high-impedance state, allowing configuration settings to be modified without directly affecting the DUT, thus eliminating signal glitches while maintaining configuration flexibility.
3Measurement precision
If multiple mode changes are performed in sequence, then measurement precision is improved, but transition time increases
Solution Approach 1:
The patent segments the mode transition process into distinct, controlled stages: exiting DUT driving mode, transitioning to DUT non-driving mode, performing configuration changes, and re-entering DUT driving mode. This segmentation allows each stage to be optimized independently, ensuring that configuration changes are made with proper timing and sequencing, which maintains measurement precision while managing overall transition time through systematic organization of the transition path.
Data Source
AI summary
In described examples, a test control circuit includes a subsystem and a transition control circuit. The subsystem outputs test signals to, and receives and measures response signals of, a device under test (DUT). The transition control circuit operates the test control circuit in response to a first operational state information indicating a first mode and a first set of configuration settings; receives a Transition Trigger signal and a second operational state information indicating a second mode and a second set of configuration settings; and, by performing allowed mode changes and in response to receiving the Transition Trigger signal, transitions the test control circuit to operating in response to the second operational state information. Allowed mode changes are restricted to: from a DUT driving mode to a DUT non-driving mode, from a DUT non-driving mode to another DUT non-driving mode, or from a DUT non-driving mode to a DUT driving mode.