Automated Test Systems TRIZ Cases
- Machine Learning Margin Tester Calibration for PCIe Testing
Neural networks map margin tester signatures to reference instrument spaces, resolving instrument-to-instrument variability while boosting testing throughput.
- Transistor Current Limit Testing with Internal Test Resistor
A transistor device incorporates an internal test resistor to simulate external resistance for automated testing equipment calibration.
- Semiconductor Test System Tabular Plan Parallel Execution
A semiconductor test system executes tabular plans via asynchronous parallel threads to boost throughput.
- Parametric Measurement Unit State Transition Control
Transition control circuit routes parametric measurement units through non-driving modes to eliminate signal glitches during configuration changes.
- Semiconductor Test Board Sequential DC Measurement
Sequential direct current testing on a shared wiring board identifies individual semiconductor device acceptability while reducing test time and cost.