Semiconductor Test Board Sequential DC Measurement
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Solution Overview
Problem
Current semiconductor device testing methods, such as the DC parametric test, face challenges in determining the direct current characteristics of individual devices on a test board with multiple devices connected to one wiring, leading to increased test time and cost, and the inability to accurately identify defective products before burn-in or reliability tests.
Innovation Solution
A test system that includes a test board with sequentially connected sockets, a measuring apparatus for simultaneous direct current tests, and a determining apparatus that assesses device acceptability based on changes in measured values when devices are added or removed, allowing for efficient identification of defective products and reducing the need for multiple drivers.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If a test board with multiple semiconductor devices connected to one wiring is used, then test cost is reduced, but the direct current characteristics of individual semiconductor devices cannot be determined
Solution Approach 1:
The patent segments the measurement process by sequentially adding or removing semiconductor devices from the test board and measuring the total direct current consumption at each step. This allows the system to determine individual device characteristics through differential measurement, resolving the contradiction between cost-effective multi-device testing and individual device measurement precision
Solution Approach 2:
Instead of measuring each device individually (traditional approach), the patent inverts the approach by measuring the total consumption of multiple devices and using sequential addition/removal to deduce individual characteristics. This inversion maintains low test cost while achieving individual device measurement capability
2Measurement precision
If the DC parametric test is performed for each of a total number of semiconductor devices, then individual device pass/fail determination is enabled, but test time is increased
Solution Approach 1:
The patent merges multiple measurement operations into a single integrated process. By sequentially adding devices and measuring total consumption in each step, the system determines individual device characteristics without requiring separate measurement setups, thereby reducing total test time while maintaining individual device evaluation capability
Solution Approach 2:
The patent performs preliminary actions by pre-arranging semiconductor devices in a specific sequence for addition to the test board. This preliminary arrangement enables efficient sequential measurement, reducing the time required for individual device testing while ensuring accurate pass/fail determination
3Productivity
If an expensive test system is used to simultaneously drive a large number of semiconductor devices, then measurement capability is improved, but test cost is increased
Solution Approach 1:
The patent makes a single measurement system universal by enabling it to measure both individual device characteristics and total consumption of multiple devices through sequential operations. This multi-functionality eliminates the need for expensive specialized test systems while maintaining comprehensive measurement capability
Solution Approach 2:
The measurement system serves itself by using the same apparatus for both total consumption measurement and individual device characterization. The system automatically deduces individual device properties from sequential measurement data, eliminating the need for additional expensive measurement equipment
Data Source
AI summary
A test system includes: a test board on which a plurality of test target devices are mounted while being sequentially connected to one another; a measuring apparatus configured to simultaneously execute direct current tests for the test target devices mounted on the test board; and a determining apparatus configured to determine whether or not the test target devices are acceptable. The measuring apparatus executes the direct current tests every time when the number of test target devices mounted on the test board changes. The measuring apparatus determines whether or not the test target devices are acceptable on the basis of a change between measured values of the direct current tests, which follows the change of the number of test target devices mounted on the test board.