Transistor Current Limit Testing with Internal Test Resistor
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Solution Overview
Problem
Current limit testing of transistor devices is challenging with conventional automated test equipment (ATE) due to the absence of internal resistance settings, leading to increased costs and parasitic effects that affect the accuracy and stability of the testing process.
Innovation Solution
Incorporating an internal test resistor and switch controller within the transistor device to simulate an external resistor, allowing for accurate and cost-effective testing of the current limit circuit using low-cost ATE devices by dividing the test into two phases to determine and verify the resistance value of the internal test resistor.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional ATE devices are used for current limit testing, then testing capability is provided, but parasitic effects increase and measurement precision deteriorates
Solution Approach 1:
An internal test resistor is introduced as an intermediary component between the ATE device and the transistor device under test. This test resistor serves as a mediator that eliminates parasitic effects by providing a known, controlled resistance path for calibration current, allowing accurate measurement of the current limit circuit without the harmful parasitic effects present in conventional ATE connections.
2Measurement precision
If internal test resistor is added to the transistor device, then measurement precision improves, but device complexity increases
Solution Approach 1:
The testing functionality is extracted from the external ATE device and integrated into the transistor device itself through the internal test resistor. By taking out the calibration function and placing it within the DUT, the system achieves self-contained testing capability with improved precision while the added complexity is confined to the device interior rather than requiring complex external equipment.
3Ease of manufacture
If conventional testing methods are used, then testing can be performed, but manufacturing cost increases
Solution Approach 1:
The internal test resistor is implemented as a simple, inexpensive component that can be easily fabricated alongside the transistor device. This disposable-like component provides accurate testing capability without requiring expensive specialized ATE equipment, thereby reducing manufacturing costs while maintaining measurement precision through its known resistance value.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables precise and inexpensive testing of the current limit circuit without parasitic effects, ensuring compliance with industry standards and reducing the overall fabrication cost of integrated circuits.
Implementation Method 1
conduct a calibration current through an internal test resistor for the ATE device to determine a resistance value of the internal test resistor
Implementation Method 2
a current limit circuit configured to regulate an amplitude of operational current through the transistor device between the first and second terminals during a normal operating mode
Data Source
AI summary
One example includes a circuit. The circuit includes a transistor device arranged between a first terminal and a second terminal and a transistor device controller configured to control operation of the transistor device. The circuit further includes a current limit controller that includes a current limit circuit configured to regulate an amplitude of operational current through the transistor device between the first and second terminals during a normal operating mode, and a testing system configured to conduct a calibration current provided by an automated testing equipment (ATE) device through an internal test resistor for the ATE device to determine a resistance value of the internal test resistor during a test mode to facilitate testing of the current limit circuit via a test current provided by the ATE device between the first and second terminals through the transistor device based on the determined resistance value of the internal test resistor.